Assignee
ADLER DAVID LEWIS
US·2 granted patents·1 pending application·89 citations·filing 2013–2016
Top patents by PatentIndex Score
3 records- 0195US9607724B2Devices processed using x-raysADLER DAVID LEWIS·Filed 2015·Granted Mar 28, 2017·11 cites·24 claims
- 0294US9129715B2High speed x-ray inspection microscopeADLER DAVID LEWIS·Filed 2013·Granted Sep 8, 2015·78 cites·43 claims
- 0353US2016203938A1Integrated devices with photoemissive structuresADLER DAVID LEWIS·Filed 2016·Application pending·0 cites
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