Assignee
SUZAWA HIDEOMI
JP·20 granted patents·666 citations·filing 2007–2012
Top patents by PatentIndex Score
20 records- 0198US8501564B2Semiconductor element, semiconductor device, and method for manufacturing the sameSUZAWA HIDEOMI·Filed 2010·Granted Aug 6, 2013·231 cites·33 claims
- 0298US8242494B2Method for manufacturing thin film transistor using multi-tone maskSUZAWA HIDEOMI·Filed 2009·Granted Aug 14, 2012·130 cites·30 claims
- 0398US8236635B2Method for manufacturing semiconductor deviceSUZAWA HIDEOMI·Filed 2009·Granted Aug 7, 2012·139 cites·18 claims
- 0497US8912040B2Method for manufacturing semiconductor deviceSUZAWA HIDEOMI·Filed 2011·Granted Dec 16, 2014·23 cites·54 claims
- 0596US8207025B2Manufacturing method of semiconductor deviceSUZAWA HIDEOMI·Filed 2011·Granted Jun 26, 2012·25 cites·28 claims
- 0695US9023684B2Semiconductor device and manufacturing method thereofSUZAWA HIDEOMI·Filed 2012·Granted May 5, 2015·21 cites·15 claims
- 0795US8729546B2Method for manufacturing semiconductor deviceSUZAWA HIDEOMI·Filed 2012·Granted May 20, 2014·18 cites·18 claims
- 0893US8093591B2Semiconductor device and manufacturing method thereofSUZAWA HIDEOMI·Filed 2009·Granted Jan 10, 2012·13 cites·26 claims
- 0992US8470647B2Semiconductor device and manufacturing method thereofSUZAWA HIDEOMI·Filed 2007·Granted Jun 25, 2013·15 cites·14 claims
- 1089US8674366B2Display device and manufacturing method of display deviceSUZAWA HIDEOMI·Filed 2010·Granted Mar 18, 2014·7 cites·32 claims
- 1187US8686417B2Oxide semiconductor device formed by using multi-tone maskSUZAWA HIDEOMI·Filed 2012·Granted Apr 1, 2014·7 cites·24 claims
- 1287US8624248B2Semiconductor device and manufacturing method thereofSUZAWA HIDEOMI·Filed 2011·Granted Jan 7, 2014·5 cites·40 claims
- 1387US8592879B2Method for manufacturing semiconductor deviceSUZAWA HIDEOMI·Filed 2011·Granted Nov 26, 2013·8 cites·21 claims
- 1486US8461596B2Semiconductor device including semiconductor film with outer end having tapered shapeSUZAWA HIDEOMI·Filed 2011·Granted Jun 11, 2013·5 cites·20 claims
- 1584US8431449B2Manufacturing method of semiconductor deviceSUZAWA HIDEOMI·Filed 2011·Granted Apr 30, 2013·7 cites·24 claims
- 1678US8653513B2Semiconductor device with sidewall insulating layerSUZAWA HIDEOMI·Filed 2011·Granted Feb 18, 2014·5 cites·28 claims
- 1774US9045831B2Wiring and manufacturing method thereof, semiconductor device comprising said wiring, and dry etching methodSUZAWA HIDEOMI·Filed 2008·Granted Jun 2, 2015·3 cites·11 claims
- 1874US8207026B2Manufacturing method of thin film transistor and manufacturing method of display deviceSUZAWA HIDEOMI·Filed 2010·Granted Jun 26, 2012·4 cites·36 claims
- 1943US9006732B2Manufacturing method of semiconductor deviceSUZAWA HIDEOMI·Filed 2012·Granted Apr 14, 2015·0 cites·19 claims
- 2041US8778729B2Manufacturing method of semiconductor deviceSUZAWA HIDEOMI·Filed 2011·Granted Jul 15, 2014·0 cites·44 claims
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