Assignee
SUTANI TAKUMICHI
JP·2 granted patents·1 pending application·8 citations·filing 2009–2012
Top patents by PatentIndex Score
3 records- 0181US8173962B2Pattern displacement measuring method and pattern measuring deviceSUTANI TAKUMICHI·Filed 2010·Granted May 8, 2012·6 cites·4 claims
- 0274US8507856B2Pattern measuring method and pattern measuring deviceSUTANI TAKUMICHI·Filed 2012·Granted Aug 13, 2013·2 cites·8 claims
- 0360US2009200465A1Pattern measuring method and pattern measuring deviceSUTANI TAKUMICHI·Filed 2009·Application pending·0 cites
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