Calibration method for slice level of zero cross signal and method of producing track-crossing signal

Abstract

A calibration method for a slice level of zero cross signal and a method of producing zero cross signal are disclosed. In this invention, the positive cycle and the negative cycle of the zero cross signal are sampled to obtain an error value related to the slice level due to asymmetry of the zero cross signal. By this invention, the asymmetry between the positive cycle and the negative cycle of the zero cross signal can be adjusted.

1. A calibration method for a slice level of a signal in an optical storage device, comprising:
 providing a current slice level of the signal;  
 comparing the current slice level with the signal to obtain a zero cross signal of the signal;  
 sampling the zero cross signal of the signal to obtain an error value; and  
 generating a next slice level based on the current slice level and the error value.  
 
     
     
       2. The method of  claim 1 , wherein the sampling step comprises sampling a first half cycle and a second half cycle of the zero cross signal to obtain a first sampling number and a second sampling number. 
     
     
       3. The method of  claim 2 , wherein the step of obtaining the error value comprises obtaining the error value based on the first sampling number and the second sampling number. 
     
     
       4. The method of  claim 2 , further comprising:
 updating the second sampling number when the zero cross signal is positive; and  
 obtaining the error value based on the first sampling number and the updated second sampling number.  
 
     
     
       5. The method of  claim 2 , further comprising:
 updating the first sampling number when the zero cross signal is negative; and  
 obtaining the error value based on the updated first sampling number and the second sampling number.  
 
     
     
       6. A method for producing a zero cross signal of a signal in an optical storage drive, comprising:
 providing a current slice level of the signal;  
 comparing the current slice level with the signal to obtain a current zero cross signal of the signal;  
 sampling the current zero cross signal of the signal to obtain an error value;  
 obtaining a next slice level based on the current slice level and the error value; and  
 comparing the next slice level with the signal to obtain a next zero cross signal of the signal.  
 
     
     
       7. The method of  claim 6 , wherein the sampling step comprises:
 sampling a first half cycle and a second half cycle of the zero cross signal to obtain a first sampling number and a second sampling number.  
 
     
     
       8. The method of  claim 7 , wherein the step of obtaining the error value comprises obtaining the error value based on the first sampling number and the second sampling number. 
     
     
       9. The method of  claim 7 , further comprising:
 updating the second sampling number when the zero cross signal is positive; and  
 obtaining the error value based on the first sampling number and the updated second sampling number.  
 
     
     
       10. The method of  claim 7 , further comprising:
 updating the first sampling number when the zero cross signal is negative; and  
 obtaining the error value based on the updated first sampling number and the second sampling number.  
 
     
     
       11. A calibration method for a slice level of a signal in an optical storage drive, comprising:
   sampling a zero cross signal of the signal to obtain an error value, wherein the zero cross signal is obtained by comparing a current slice level with the signal; and        generating a next slice level based on the current slice level and the error value.     
     
     
       12. The method of  claim 11 , wherein the sampling step comprises sampling a first half cycle and a second half cycle of the zero cross signal to obtain a first sampling number and a second sampling number. 
     
     
       13. The method of  claim 12 , wherein the step of obtaining the error value comprises obtaining the error value based on the first sampling number and the second sampling number. 
     
     
       14. The method of  claim 12 , further comprising:
   updating the second sampling number when the zero cross signal is positive; and        obtaining the error value based on the first sampling number and the updated second sampling number.     
     
     
       15. The method of  claim 12 , further comprising:
   updating the first sampling number when the zero cross signal is negative; and        obtaining the error value based on the updated first sampling number and the second sampling number.     
     
     
       16. A method for producing a zero cross signal of a signal in an optical storage drive, comprising:
   sampling a current zero cross signal of the signal to obtain an error value, wherein the current zero cross signal is obtained by comparing a current slice level with the signal;        obtaining a next slice level based on the current slice level and the error value; and        comparing the next slice level with the signal to obtain a next zero cross signal of the signal.     
     
     
       17. The method of  claim 16 , wherein the sampling step comprises:
   sampling a first half cycle and a second half cycle of the zero cross signal to obtain a first sampling number and a second sampling number.     
     
     
       18. The method of  claim 17 , wherein the step of obtaining the error value comprises obtaining the error value based on the first sampling number and the second sampling number. 
     
     
       19. The method of  claim 17 , further comprising:
   updating the second sampling number when the zero cross signal is positive; and        obtaining the error value based on the first sampling number and the updated second sampling number.     
     
     
       20. The method of  claim 17 , further comprising:
   updating the first sampling number when the zero cross signal is negative; and        obtaining the error value based on the updated first sampling number and the second sampling number.