Contact array assembly for a computer-controlled printed circuit board testing apparatus

Abstract

A contact array assembly for use with a computer-controlled printed circuitoard testing apparatus includes an array of contacts into segments individually and releasably supported by supporting rods resting in a base plate. The space so created is utilized for accommodating the electronic circuitry components associated with these contact array segments and connected through plug-type connectors to a two-dimensional addressing and control logic on the base plate. These constructional units, referred to as modules or driver plates, are identical and may replace each other in any of the positions on the base plate. The invention results in a printed circuit board testing apparatus which may be designed for a very large number of contacts, but can be operated initially with a reduced amount of electronic circuitry and may be expanded later on, as desired.

What is claimed is: 
     
       1. In an assembly for use with a computer-controlled printed circuit board testing apparatus for determining whether the electrical connections of printed circuit boards to be tested correspond to computer-memorized connections of a master printed circuit board, the testing apparatus being of the type including controlling computer logic, .Iadd.and .Iaddend.a plurality of contact members supported by the apparatus to be pressed by a printed circuit board to be tested such that electrical connections of the printed circuit board to be tested contact the contact members .Iadd.via a mount provided to receive the printed circuit board, .Iaddend.the contact members being arranged within a grid-like array of equally sized segments, .Iadd.said assembly including .Iaddend.means for electrically connecting the contact members to the controlling computer logic, and means for absorbing the pressure of the printed circuit board to be tested being pressed against the contact members .Iadd.via the mount, .Iaddend.the improvement .[.wherein said assembly comprises.]. .Iadd.comprising: .Iaddend. a base plate to be supported in spaced relationship below the contact members of the testing apparatus;   said connecting means including a plurality of modules of identical construction extending upwardly from said base plate;   each said module including an upper connector having an outer contour defining a respective segment and defining therebelow a space limited by said outer contour, said upper connector having an arrangement of contacts to be connected to the contact .[.elements.]. .Iadd.members .Iaddend.of the testing apparatus upon a printed circuit board to be tested being pressed thereon .Iadd.via the mount, .Iaddend.and upper surfaces of said upper connectors defining a contact plane;   each said module including electronic components confined within the respective said space and connected to said contacts of the respective said upper connector; and   each said module including a lower connector means, located within the respective said space and connected to the respective said electronic components, for electrically connecting said respective electronic components to the controlling computer logic of the testing apparatus;   wherein said pressure absorbing means comprises, for each said module, at least one supporting rod .Iadd.directly .Iaddend.connected to .Iadd.and supporting .Iaddend.the respective said upper connector and extending downwardly through the respective said space and releasably supported by said base plate;   whereby said modules may be selectively relocated on said base plate and selected said modules may be removed from said assembly or additional modules may be added thereto, such that said assembly may be employed to test printed circuit boards of various different sizes and shapes.   
     
     
       2. The improvement claimed in claim 1, wherein each said module further includes a multi-layer circuit board within the respective said space and secured to the respective said supporting rod, and the respective .[.said.]. electronic components .Iadd.of the testing apparatus .Iaddend.are disposed on said circuit board. 
     
     
       3. The improvement claimed in claim 1, wherein said supporting rod has a reduced size lower end fitting into a complementary shaped opening in said base plate. 
     
     
       4. The improvement claimed in claim 1, wherein each said module includes two said supporting rods extending from the respective said upper connector. 
     
     
       5. The improvement claimed in claim 1, wherein said base plate has therein a grid of openings receiving reduced size end portions of said supporting rods. 
     
     
       6. The improvement claimed in claim 1, wherein each said upper connector comprises a plug-in connector having an outer configuration defining said contour. 
     
     
       7. The improvement claimed in claim 6, further comprising a plurality of contact pins .[.acted on by the.]. .Iadd.comprising .Iaddend.contact members of the testing apparatus and extending into said plug-in connectors to contact said contacts thereof. 
     
     
       8. The improvement claimed in claim 7, further comprising a perforated grid plate through which extend said contact pins for a plurality of said connectors. 
     
     
       9. The improvement claimed in claim 1, wherein each said lower connector means comprises a plug-in connector located above said base plate a sufficient distance to remain unloaded by contact pressure acting on the respective said upper connector. 
     
     
       10. The improvement claimed in claim 1, wherein said base plate has thereon means defining a plurality of contact positions aligned with respective said spaces. 
     
     
       11. The improvement claimed in claim 10, further comprising a control circuit board forming part of the controlling computer logic of the testing apparatus and supported on said base plate, said control circuit board including said contact position defining means. 
     
     
       12. The improvement claimed in claim 11, wherein said contact position defining means comprises upright contact pins extending upwardly from said control circuit board at positions to be connected to respective said lower connector means. 
     
     
       13. The improvement claimed in claim 12, further comprising an insulating plate positioned between said base plate and said control circuit board. 
     
     
       14. .[.A.]. .Iadd.In a .Iaddend.contact module for use with a computer-controlled printed circuit board testing apparatus for determining whether .[.the positions of.]. the electrical connections of printed circuit boards to be tested correspond to computer-memorized .[.information.]. .Iadd.connections .Iaddend.of a master printed circuit board, the testing apparatus being of the type including controlling computer logic, a base plate, a plurality of contact members supported by the apparatus to be pressed by a printed circuit board to be tested such that electrical connections of the printed circuit board to be tested contact the contact members .Iadd.via a mount to receive the printed circuit board, .Iaddend.the contact member being arranged within a grid-like array of equally sized segments, means for electrically connecting the contact members to the controlling computer logic, and means for absorbing the pressure of the printed circuit board to be tested being pressed against the contact members .Iadd.via the mount, .Iaddend..Iadd.the improvement wherein .Iaddend.said contact module .[.including.].  .Iadd.includes .Iaddend.the connecting means and the pressure absorbing means of the testing apparatus and comprising: an upper connector having an outer contour defining a respective segment and defining therebelow a space limited by said outer contour, said upper connector having an arrangement of contacts to be connected to the contact .[.elements.]. .Iadd.members .Iaddend.of the testing apparatus upon a printed circuit board to be tested being pressed thereon .Iadd.via the mount.Iaddend., and said upper connector having an upper surface extending in a contact plane to be defined by upper surfaces of .[.uppers.]. .Iadd.upper .Iaddend.connectors of an assembly formed by a plurality of .[.said.]. .Iadd.similar .Iaddend.modules;   at least one supporting rod .Iadd.directly .Iaddend.connected .Iadd.to and supporting .Iaddend.said upper connector and extending downwardly therefrom through said space, said supporting rod having at a lower end thereof means for releasable connection to the base plate of the testing apparatus;   electronic components confined within said space and connected to said contacts of said upper connector; and   lower connector means, located within said space and connected to said electronic components, for electrically connecting said electronic components to the controlling computer logic of the testing apparatus.   
     
     
       15. A module as claimed in claim 14, further comprising a multi-layer circuit board within said space and secured to said supporting rod .[.said.]. .Iadd.and .Iaddend.electronic components .Iadd.of the testing apparatus .Iaddend.being disposed on said circuit board. 
     
     
       16. A module as claimed in claim 14, wherein said upper connector comprises a plug-in connector having an outer configuration defining said contour. 
     
     
       17. A module as claimed in claim 16, further comprising a plurality of contact pins .[.to be acted on by the.]. .Iadd.comprising .Iaddend.contact members of the testing apparatus and extending into said plug-in connector to contact said contacts thereof. 
     
     
       18. A module as claimed in claim 14, wherein said lower end of said supporting rod is of reduced size to be fitted into a complementary shaped opening in the base plate of the testing apparatus. 
     
     
       19. A module as claimed in claim 14, comprising two said supporting rods extending from said upper connector. 
     
     
       20. A module as claimed in claim 14, wherein said lower connector means comprises a plug-in connector.