Method for analyzing materials using x-ray fluorescence

Abstract

A method of identifying the presence, and amount, of elemental constituents in a material. The method uses an apparatus known for use in measuring extended x-ray absorption fine structure, and adapts it to the measurement of x-ray appearance potential in a manner to yield both qualitative and quantitative information about the elemental constituents of the material. The source of x-rays can be a synchrotron, which, because of its high power output, increases the speed and sensitivity of the measurements, permitting the use of less sensitive x-ray detectors to yield statistically significant data.

What is claimed and desired to be secured by Letters Patent of the United States is: 
     
       1. A method of identifying at least one elemental; constituent of a material sample, said method comprising steps for: (a) exposing said sample for a preselected time to a substantially monochromatic x-ray beam of preselected frequency;   (b) measuring the amount of fluorescence emitted by said sample into a preselected solid angle during said preselected time responsive to said step for exposing;   (c) measuring the amount of energy delivered to said sample in said preselected time by step (a);   (d) varying the frequency of said monochromatic x-ray beam;   (e) repeating steps (a) through (d) a sufficient number of times to identify an absorption edge transition of said elemental constituent of said sample;   (f) measuring the change of magnitude of said amount of fluorescence at said absorption edge;   (g) using said change of magnitude to calculate the amount of said elemental constituent of said sample.