USD721606SActiveUtility

Test device

24
Assignee: OMICRON ELECTRONICS GMBHPriority: Dec 21, 2012Filed: Jun 21, 2013Granted: Jan 27, 2015
Est. expiryDec 21, 2032(~6.4 yrs left)· nominal 20-yr term from priority
Inventors:Simon Mayr
24
PatentIndex Score
3
Cited by
2
References
1
Claims

Claims

exact text as granted — not AI-modified
CLAIM 
     
       The ornamental design for a test device, as shown and described.

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