USD444401SExpiredUtility

Electrical test probe wedge tip

62
Assignee: LECROY CORPPriority: Jul 31, 2000Filed: Jul 31, 2000Granted: Jul 3, 2001
Est. expiryJul 31, 2020(expired)· nominal 20-yr term from priority
Inventors:Julie A. Campbell
62
PatentIndex Score
12
Cited by
2
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for an electrical test probe wedge tip, as shown and described.

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