USD427088SExpiredUtility

Wafer level burn-in tester

38
Assignee: MATSUSHITA ELECTRIC INDUSTRIAL CO LTDPriority: Jul 9, 1999Filed: Nov 29, 1999Granted: Jun 27, 2000
Est. expiryJul 9, 2019(expired)· nominal 20-yr term from priority
Inventors:Yoshihiko AsaiYoshikazu Ezawa
38
PatentIndex Score
4
Cited by
5
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for a wafer level burn-in tester, as shown and described.

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