USD360598SExpiredUtility

Console for measurement scanner for semi-conductor

31
Assignee: HITACHI LTDPriority: Apr 15, 1994Filed: Jul 26, 1994Granted: Jul 25, 1995
Est. expiryApr 15, 2014(expired)· nominal 20-yr term from priority
Inventors:Toshihiko WadaOsamu YamadaShinobu Otsuka
31
PatentIndex Score
1
Cited by
3
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for a console for measurement scanner for semi-conductor, as shown.

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