USD354923SExpiredUtility

Probing head for an electrical test probe

Assignee: TEKTRONIX INCPriority: Jan 31, 1994Filed: Jan 31, 1994Granted: Jan 31, 1995
Est. expiryJan 31, 2014(expired)· nominal 20-yr term from priority
61
PatentIndex Score
10
Cited by
5
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for a probing head for an electrical test probe, as shown and described.

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