USD323628SExpiredUtility
Semiconductor wafer measuring instrument
Est. expiryApr 25, 2009(expired)· nominal 20-yr term from priority
Inventors:Itaru Takao
36
PatentIndex Score
2
Cited by
13
References
1
Claims
Claims
exact text as granted — not AI-modifiedThe ornamental design for a semiconductor wafer measuring instrument, as shown and described.
Join the waitlist — get patent alerts
Track USD323628S — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.