USD320755SExpiredUtility

Intergrated circuit tester

24
Assignee: HILEVEL TECHPriority: Jan 11, 1989Filed: Jan 11, 1989Granted: Oct 15, 1991
Est. expiryJan 11, 2009(expired)· nominal 20-yr term from priority
Inventors:Bjorn M. DahlbergCharles H. SchwarMauro V. Tegethoff
24
PatentIndex Score
1
Cited by
8
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for a intergrated circuit tester, as shown and described.

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