USD307724SExpiredUtility

Defect inspection device for semiconductors

31
Assignee: TOSHIBA KKPriority: Jun 25, 1987Filed: Dec 18, 1987Granted: May 8, 1990
Est. expiryJun 25, 2007(expired)· nominal 20-yr term from priority
Inventors:Yoshiaki Nishida
31
PatentIndex Score
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Cited by
4
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for a defect inspection device for semiconductors, as shown.

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