USD292979SExpiredUtility

Automatic semiconductor wafer tester

Assignee: PROMETRIX CORPPriority: Apr 26, 1985Filed: Apr 26, 1985Granted: Dec 1, 1987
Est. expiryApr 26, 2005(expired)· nominal 20-yr term from priority
Inventors:Marland Chow
59
PatentIndex Score
9
Cited by
5
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for an automatic semiconductor wafer tester, as shown.

Join the waitlist — get patent alerts

Track USD292979S — get alerts on status changes and closely related new filings.

We store only your email — no account needed. See our privacy policy.