USD272913SExpiredUtility

Combined handling, testing, and sorting machine for integrated circuits

41
Assignee: ContrelPriority: Jun 16, 1980Filed: Jun 16, 1980Granted: Mar 6, 1984
Est. expiryJun 16, 2000(expired)· nominal 20-yr term from priority
Inventors:Claude M. Boissicat
41
PatentIndex Score
5
Cited by
5
References
1
Claims

Claims

exact text as granted — not AI-modified
The ornamental design for a combined handling, testing, and sorting machine for integrated circuits, substantially as shown and described.

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