USD1116883SActiveUtility

Measuring device for x-ray emission spectrochemical analysis

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Assignee: RIGAKU DENKI CO LTDPriority: Jun 25, 2024Filed: Nov 27, 2024Granted: Mar 10, 2026
Est. expiryJun 25, 2044(~17.9 yrs left)· nominal 20-yr term from priority
Inventors:TAKAHARA HIKARIIKESAKA KENJIAOYAGI KOICHIMATSUFUJI KAZUKIIKEJIRI SHINYA
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PatentIndex Score
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Cited by
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References
1
Claims

Claims

exact text as granted — not AI-modified
CLAIM 
     
       The ornamental design for measuring device for x-ray emission spectrochemical analysis as shown.

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