USD1110279SActiveUtility

Contact pin for integrated circuit testing

30
Assignee: JOHNSTECH INT CORPPriority: Apr 5, 2022Filed: May 7, 2024Granted: Jan 27, 2026
Est. expiryApr 5, 2042(~15.6 yrs left)· nominal 20-yr term from priority
Inventors:HASSKAMP MELISSA
30
PatentIndex Score
0
Cited by
36
References
1
Claims

Claims

exact text as granted — not AI-modified
CLAIM 
     
       The ornamental design for a contact pin for integrated circuit testing as shown and described.

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