USD1075695SActiveUtility

Contact pin for integrated circuit testing

49
Assignee: JOHNSTECH INT CORPPriority: Apr 5, 2022Filed: Nov 17, 2023Granted: May 20, 2025
Est. expiryApr 5, 2042(~15.7 yrs left)· nominal 20-yr term from priority
Inventors:Melissa Hasskamp
49
PatentIndex Score
1
Cited by
37
References
1
Claims

Claims

exact text as granted — not AI-modified
CLAIM 
     
       The ornamental design for a contact pin for integrated circuit testing as shown and described.

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