US9608090B2ActiveUtilityA1
Method for fabricating semiconductor device having fin structure that includes dummy fins
Est. expiryDec 3, 2034(~8.3 yrs left)· nominal 20-yr term from priority
Inventors:En-Chiuan Liou
H10D 64/0112H10W 20/0698H01L 29/7853H01L 29/161H01L 29/7845H01L 21/76895H01L 29/66795H01L 2029/7858H01L 29/24H01L 29/7848H01L 29/165H01L 29/41791H01L 29/6681H01L 29/7854H01L 29/7856H01L 21/823431H01L 29/785H01L 21/28518H01L 29/267H10D 84/0158H10D 84/038H10D 62/832H10D 62/822H10D 62/82H10D 62/80H10D 30/6219H10D 30/6217H10D 30/6213H10D 30/6212H10D 30/797H10D 30/794H10D 30/62H10D 30/024H10D 30/0243
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Claims
Abstract
A method for fabricating semiconductor device is disclosed. First, a substrate, and a sacrificial mandrel is formed on the substrate, in which the sacrificial mandrel includes a first side and a second side with the indentation. Next, a spacer is formed adjacent to the first side and the second side of the sacrificial mandrel, the sacrificial mandrel is removed, and the spacer is used to remove part of the substrate for forming a fin-shaped structure and a dummy fin-shaped structure.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1. A method for fabricating semiconductor device, comprising:
providing a substrate;
forming a sacrificial mandrel on the substrate, wherein the sacrificial mandrel comprises an indentation; and
forming a spacer adjacent to the sacrificial mandrel.
2. The method of claim 1 , wherein the sacrificial mandrel comprises a first side and a second side with the indentation, the method further comprises;
forming the spacer adjacent to the first side and the second side;
removing the sacrificial mandrel; and
using the spacer to remove part of the substrate for forming a fin-shaped structure and a dummy fin-shaped structure.
3. The method of claim 2 , wherein the dummy fin-shaped structure comprises a curve.
4. The method of claim 3 , wherein the curve is omega shaped.
5. The method of claim 2 further comprising:
performing a fin-cut process;
forming a gate structure on the fin-shaped structure;
forming a first epitaxial layer on the fin-shaped structure adjacent to two sides of the gate structure and a second epitaxial layer on the dummy fin-shaped structure; and
forming a contact plug on the first epitaxial layer and the second epitaxial layer.
6. The method of claim 5 , further comprising:
forming a silicide on the first epitaxial layer and the second epitaxial layer; and
forming the contact plug on the silicide.Join the waitlist — get patent alerts
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