Method and device for indicating automatically identified flaws

Abstract

A method is provided for indicating automatically identified flaws on or in a test specimen. A location of a defect on or in a test specimen identified by an inspection unit is subsequently indicated. A lighting unit, for example color LEDs, is used to generate an illuminated indicator marking the location of the defect on the surface or on at least one adjoining lateral edge of the test specimen. After the automatic identification of the flaw, it is checked on the basis of quantifiable properties of the defect whether the defect meets a predefinable quality criterion, and an illuminated indicator marking the location of the defect at or on the test specimen is generated only if the quality criterion is not met. The coloring of the marking illuminated indicator is predefined depending on quantifiable properties of the defect.

The invention claimed is: 
     
       1. Method for indicating automatically identified defects on or in a test specimen, comprising
 indicating an identified location of a defect on or in a test specimen by an inspection unit, 
 after automatic identification of the defect, checking based on quantifiable properties of the defect whether the test specimen, despite the defect, meets a predefinable quality criterion, and 
 subsequent to indicating the location of the defect with the inspection unit, generating an illuminated indicator marking the location of the defect on the surface of the test specimen by a lighting unit behind the test specimen or in the area of at least one adjoining lateral edge of the test specimen only if the quality criterion is not met, the lighting unit being separate from the inspection unit. 
 
     
     
       2. The method according to  claim 1 , wherein multiple defects are simultaneously, successively or alternatingly indicated with the marking illuminated indicator. 
     
     
       3. The method according to  claim 1 , wherein an expansion and/or an orientation of a non-radially symmetrical marking illuminated indicator and/or a coloring of the marking illuminated indicator is predefined depending on the quantifiable properties of the defect. 
     
     
       4. The method according to  claim 1 , wherein in addition or alternatively, further properties of the test specimen are indicated by the marking illuminated indicator. 
     
     
       5. The method according to  claim 1 , wherein the marking illuminated indicator is carried along with a moving test specimen. 
     
     
       6. The method according to  claim 1 , wherein any defects occurring in multiple test specimens transported simultaneously next to one another can be indicated by the marking illuminated indicator. 
     
     
       7. Device for indicating automatically identified flaws on a surface of a test specimen after identification of the flaws by an inspection unit, the device comprising
 the inspection unit for automatically indicating an identified location of a defect on or in the test specimen, 
 a positioning means for the test specimen and a lighting unit, the positioning means and the lighting unit being separate from the inspection unit, 
 wherein, after automatic identification of the defect and checking whether, based on quantifiable properties of the defect, the test specimen, despite the defect, meets a predefinable quality criterion, the lighting unit is arranged to generate an illuminated indicator marking the location of the defect on the surface or at least at one adjoining lateral edge of the test specimen only if the quality criterion is not met. 
 
     
     
       8. The device according to  claim 7 , wherein the lighting unit includes at least one light rail with multiple serially arranged light sources. 
     
     
       9. The device according to  claim 8 , wherein the lighting unit includes two light rails arranged substantially perpendicular to one another or at an angle to one another, each including multiple serially arranged light sources. 
     
     
       10. The device according to  claim 7 , wherein the lighting unit comprises an area light source composed of multiple separately controllable segments, the segments corresponding to individual areas of the surface of the test specimen. 
     
     
       11. The device according to  claim 10 , wherein the test specimen consists of a transparent material and is arranged with its surface directly adjacent to the area light source, such that each area of the surface of the test specimen can be illuminated by a corresponding segment of the area light source. 
     
     
       12. The device according to  claim 7 , wherein the lighting unit includes at least one pivotable or movable light source arranged at a distance from the test specimen. 
     
     
       13. The device according to  claim 12 , wherein the light source is arranged to generate an illuminated marking that is predefinable with respect to its shape and size. 
     
     
       14. The device according to  claim 12 , wherein the light source is arranged to generate an illuminated marking in different colors.