Test device and operating method thereof

Abstract

A test device includes a circuit modelling portion suitable for generating one or more model circuits by modelling a test-object circuit with a one-to-one or a one-to-multi relationship between the test-object circuit and the model circuits, and a test operation portion suitable for synthesizing the model circuits and performing a test operation on the model circuits.

What is claimed is: 
     
       1. A test device comprising:
 a circuit modelling portion suitable for generating one or more model circuits by modelling a test-object circuit in a one-to-one ratio relationship between the test-object circuit and the model circuits or in a one-to-multi ratio relationship between the test-object circuit and the model circuits; and 
 a test operation portion suitable for synthesizing the model circuits and performing a test operation on the model circuits, 
 wherein the circuit modelling portion models the test-object circuit with the one-to-multi relationship to generate the model circuits of different types based on a delay amount of the test-object circuit. 
 
     
     
       2. A method of operating a test device comprising:
 at a circuit modelling portion, modelling a first test-object circuit of test-object circuits in a one-to-one ratio relationship between the first test-object circuit and a first model circuit to generate the first model circuit; 
 at the circuit modeling portion, modelling a second test-object circuit of the test-object circuits in a one-to-multi ratio relationship between the second test-object circuit and a second model circuit to generate the second model circuit; and 
 at a test operation circuit, performing a test operation by synthesizing the first and second model circuits, 
 wherein the modelling of the second test-object circuit comprises: 
 determining a circuit type of the second model circuit based on a delay amount of the second test-object circuit. 
 
     
     
       3. The method of  claim 2 , wherein the modelling of the second test-object circuit comprises:
 generating the second model circuit of a first type when the delay amount less than a predetermined delay amount; and 
 generating the second model circuit of a second type when the delay amount is greater than or equal to the predetermined delay amount. 
 
     
     
       4. The method of  claim 3 , wherein a circuit area of the first-typed second model circuit is proportional to the delay amount. 
     
     
       5. The method of  claim 3 , wherein the first-typed second model circuit performs a shifting operation during a period corresponding to the delay amount. 
     
     
       6. The method of  claim 3 , wherein a circuit area of the second-typed second model circuit is substantially constant regardless of the delay amount. 
     
     
       7. The method of  claim 3 , wherein the second-typed second model circuit performs a counting operation a number of times corresponding to the delay amount. 
     
     
       8. The method of  claim 3 , wherein the first-typed and second-typed second model circuits are synchronous circuits. 
     
     
       9. A test device comprising:
 a circuit modelling portion suitable for generating various types of model circuits based on a delay amount of a test-object circuit; and 
 a test operation portion suitable for synthesizing the model circuits and performing a test operation on the model circuits, 
 wherein the model circuits include a first-typed model circuit generated when the delay amount is under a predetermined delay amount, and a second-typed model circuit when the delay amount is greater than or equal to the predetermined delay amount. 
 
     
     
       10. The test device of  claim 9 , wherein a circuit area of the first-typed model circuit is proportional to the delay amount. 
     
     
       11. The test device of  claim 9 , wherein the first-typed model circuit includes a shifting circuit suitable for shifting an input signal during a period corresponding to the delay amount. 
     
     
       12. The test device of  claim 9 , wherein a circuit area of the second-typed model circuit is substantially constant regardless of the delay amount. 
     
     
       13. The test device of  claim 9 , wherein the second-typed model circuit includes:
 a counting unit suitable for counting in response to an input signal; and 
 a comparison unit suitable for comparing the delay amount with an output signal of the counting unit and outputting a result of the comparison. 
 
     
     
       14. The test device of  claim 9 , wherein the second-typed model circuit includes:
 a first latching unit suitable for latching a time corresponding to the delay amount in response to a rising edge of an input signal; 
 a second latching unit suitable for latching the time corresponding to the delay amount in response to a falling edge of the input signal; 
 a counting unit suitable for performing a counting operation in response to a clock signal; 
 a first comparison unit suitable for comparing output signals of the first latching unit and the counting unit; 
 a second comparison unit suitable for comparing output signals of the second latching unit and the counting unit; and 
 an output unit suitable for generating an output signal in response to output signals of the first and second comparison units. 
 
     
     
       15. The test device of  claim 14 , wherein the second-typed model circuit further includes an addition unit suitable for providing the first and second latching units with a sum of the output signal of the counting unit and the delay amount. 
     
     
       16. The test device of  claim 9 , wherein the first-typed and second-typed model circuits are synchronous circuits. 
     
     
       17. A method of operating a test device comprising:
 at a circuit modelling portion, generating a first netlist in response to a first delay amount; 
 at the circuit modelling portion, generating a second netlist in response to a second delay amount, which is greater than the first delay amount; 
 at a test operation circuit, testing the first and second netlists; 
 loading a delay circuit of test-object circuits; and 
 determining whether a delay amount of a loaded delay circuit is the first delay amount or the second delay amount, 
 wherein the first and second netlists are different model circuits than each other. 
 
     
     
       18. The method of  claim 17 , wherein the model circuits corresponding to the first and second netlists are synchronous circuits. 
     
     
       19. The method of  claim 17 , wherein the testing of the first and second netlists includes:
 synthesizing the first and second netlists in the test device to generate a synthesized circuit; and 
 testing the synthesized circuit.