US7786497B2ActiveUtilityA1

Pixel structure of LCD and fabrication method thereof

Assignee: AU OPTRONICS CORPPriority: May 30, 2007Filed: Jan 25, 2008Granted: Aug 31, 2010
Est. expiryMay 30, 2027(~0.9 yrs left)· nominal 20-yr term from priority
H10D 86/481H10D 86/60G02F 1/136213G02F 1/136209
77
PatentIndex Score
6
Cited by
6
References
19
Claims

Abstract

In this pixel structure, a metal layer/a dielectric layer/a heavily doped silicon layer constitutes a bottom electrode/a capacitor dielectric layer/a top electrode of a storage capacitor. At the same time, a metal shielding layer is formed under the thin film transistor to decrease photo-leakage-current.

Claims

exact text as granted — not AI-modified
1. A pixel structure of a liquid crystal display, the pixel structure comprising:
 a thin film transistor on an active area of a substrate, the thin film transistor comprises: 
 an active stack composed of a metal light-shielding layer, a dielectric layer and a silicon island, wherein the silicon island has source and drain on two ends thereof; 
 a gate dielectric layer on the active stack; and 
 at least a gate on the gate dielectric layer over the active stack; 
 a storage capacitor, having a first electrode, a capacitive dielectric layer and a second electrode from bottom to top, on a capacitive area of the substrate, wherein the first electrode and the metal light-shielding layer are discontinuous and separated from each other and are made of a first metal layer, the capacitive dielectric layer and the dielectric layer are discontinuous and separated from each other and are made of a first dielectric layer, the second electrode and the silicon island are made of a same single silicon layer and are discontinuous and separated from each other, and the second electrode is a heavily doped silicon layer and connects the drain; and 
 a pixel electrode connecting the second electrode. 
 
   
   
     2. The pixel structure of  claim 1 , further comprising two lightly doped regions between the source and the drain. 
   
   
     3. The pixel structure of  claim 1 , further comprising:
 a scan line electrically connecting the gate; 
 a second dielectric layer over the gate dielectric layer, the gate and the scan line; 
 a data line on the second dielectric layer; 
 a first conductive line on the second dielectric layer and connecting the data line and the source; and 
 a second conductive line on the second dielectric layer and connecting the second electrode to the pixel electrode. 
 
   
   
     4. The pixel structure of  claim 3 , further comprising:
 a capacitive line stack electrically connecting the storage capacitor, wherein the structure of the capacitive line stack is the same as the structure of the storage capacitor; 
 a first terminal at an end of the capacitive line stack, wherein the first terminal is made of the first metal layer; and 
 a protective layer on the first terminal, wherein the protective layer and the pixel electrode are made of a same transparent conductive layer. 
 
   
   
     5. The pixel structure of  claim 4 , further comprising a second terminal on an end of the scan line and a third terminal on an end of the data line. 
   
   
     6. The pixel structure of  claim 5 , wherein the scan line, the gate, and the second terminal are made of a second metal layer, and the data line, the first conductive line, the second conductive line and the third terminal are made of a third metal layer. 
   
   
     7. The pixel structure of  claim 3 , wherein a portion of the scan line locates on the active stack. 
   
   
     8. The pixel structure of  claim 1 , wherein the silicon layer is made from polysilicon or amorphous silicon. 
   
   
     9. The pixel structure of  claim 3 , wherein the first and the second dielectric layer are made from a material comprises silicon oxide. 
   
   
     10. The pixel structure of  claim 4 , wherein the transparent conductive layer is made from indium tin oxide, indium zinc oxide, or aluminum zinc oxide. 
   
   
     11. A pixel structure of a liquid crystal display, the pixel structure comprising:
 a thin film transistor on an active area of a substrate, the thin film transistor comprises: 
 an active stack composed of a metal light-shielding layer, a dielectric layer and a silicon island, wherein the metal light-shielding layer, the dielectric layer and the silicon island have the same pattern, and the silicon island has source and drain on two ends thereof; 
 a gate dielectric layer on the active stack; and 
 at least a gate on the gate dielectric layer over the active stack; 
 a storage capacitor, having a first electrode, a capacitive dielectric layer and a second electrode from bottom to top, on a capacitive area of the substrate, wherein the first electrode and the metal light-shielding layer are discontinuous and separated from each other and are made of a first metal layer, the capacitive dielectric layer and the dielectric layer are discontinuous and separated from each other and are made of a first dielectric layer, the second electrode and the silicon island are made of a same single silicon layer and are discontinuous and separated from each other, and the second electrode is a heavily doped silicon layer and connects the drain; 
 a scan line electrically connecting the gate; 
 a second dielectric layer over the gate dielectric layer, the gate and the scan line; 
 a data line on the second dielectric layer; 
 a first conductive line on the second dielectric layer and connecting the data line and the source; and 
 a second conductive line on the second dielectric layer and connecting the second electrode to the drain; and 
 a pixel electrode connecting the second conductive line. 
 
   
   
     12. The pixel structure of  claim 11 , further comprising two lightly doped regions between the source and the drain. 
   
   
     13. The pixel structure of  claim 11 , further comprising:
 a capacitive line stack electrically connecting the storage capacitor, wherein the structure of the capacitive line stack is the same as the structure of the storage capacitor; 
 a first terminal at an end of the capacitive line stack, wherein the first terminal is made of the first metal layer; and 
 a protective layer on the first terminal, the protective layer and the pixel electrode being made of a same transparent conductive layer. 
 
   
   
     14. The pixel structure of  claim 13 , further comprising a second terminal on an end of the scan line and a third terminal on an end of the data line. 
   
   
     15. The pixel structure of  claim 14 , wherein the scan line, the gate, and the second terminal are made of a second metal layer, and the data line, the first conductive line, the second conductive line and the third terminal are made of a third metal layer. 
   
   
     16. The pixel structure of  claim 11 , wherein a portion of the scan line locates on the active stack. 
   
   
     17. The pixel structure of  claim 11 , wherein the silicon layer is made from polysilicon or amorphous silicon. 
   
   
     18. The pixel structure of  claim 11 , wherein the first and the second dielectric layer are made from a material comprises silicon oxide. 
   
   
     19. The pixel structure of  claim 13 , wherein the transparent conductive layer is made from indium tin oxide, indium zinc oxide, or aluminum zinc oxide.

Join the waitlist — get patent alerts

Track US7786497B2 — get alerts on status changes and closely related new filings.

We store only your email — no account needed. See our privacy policy.