US7786497B2ActiveUtilityA1
Pixel structure of LCD and fabrication method thereof
Est. expiryMay 30, 2027(~0.9 yrs left)· nominal 20-yr term from priority
H10D 86/481H10D 86/60G02F 1/136213G02F 1/136209
77
PatentIndex Score
6
Cited by
6
References
19
Claims
Abstract
In this pixel structure, a metal layer/a dielectric layer/a heavily doped silicon layer constitutes a bottom electrode/a capacitor dielectric layer/a top electrode of a storage capacitor. At the same time, a metal shielding layer is formed under the thin film transistor to decrease photo-leakage-current.
Claims
exact text as granted — not AI-modified1. A pixel structure of a liquid crystal display, the pixel structure comprising:
a thin film transistor on an active area of a substrate, the thin film transistor comprises:
an active stack composed of a metal light-shielding layer, a dielectric layer and a silicon island, wherein the silicon island has source and drain on two ends thereof;
a gate dielectric layer on the active stack; and
at least a gate on the gate dielectric layer over the active stack;
a storage capacitor, having a first electrode, a capacitive dielectric layer and a second electrode from bottom to top, on a capacitive area of the substrate, wherein the first electrode and the metal light-shielding layer are discontinuous and separated from each other and are made of a first metal layer, the capacitive dielectric layer and the dielectric layer are discontinuous and separated from each other and are made of a first dielectric layer, the second electrode and the silicon island are made of a same single silicon layer and are discontinuous and separated from each other, and the second electrode is a heavily doped silicon layer and connects the drain; and
a pixel electrode connecting the second electrode.
2. The pixel structure of claim 1 , further comprising two lightly doped regions between the source and the drain.
3. The pixel structure of claim 1 , further comprising:
a scan line electrically connecting the gate;
a second dielectric layer over the gate dielectric layer, the gate and the scan line;
a data line on the second dielectric layer;
a first conductive line on the second dielectric layer and connecting the data line and the source; and
a second conductive line on the second dielectric layer and connecting the second electrode to the pixel electrode.
4. The pixel structure of claim 3 , further comprising:
a capacitive line stack electrically connecting the storage capacitor, wherein the structure of the capacitive line stack is the same as the structure of the storage capacitor;
a first terminal at an end of the capacitive line stack, wherein the first terminal is made of the first metal layer; and
a protective layer on the first terminal, wherein the protective layer and the pixel electrode are made of a same transparent conductive layer.
5. The pixel structure of claim 4 , further comprising a second terminal on an end of the scan line and a third terminal on an end of the data line.
6. The pixel structure of claim 5 , wherein the scan line, the gate, and the second terminal are made of a second metal layer, and the data line, the first conductive line, the second conductive line and the third terminal are made of a third metal layer.
7. The pixel structure of claim 3 , wherein a portion of the scan line locates on the active stack.
8. The pixel structure of claim 1 , wherein the silicon layer is made from polysilicon or amorphous silicon.
9. The pixel structure of claim 3 , wherein the first and the second dielectric layer are made from a material comprises silicon oxide.
10. The pixel structure of claim 4 , wherein the transparent conductive layer is made from indium tin oxide, indium zinc oxide, or aluminum zinc oxide.
11. A pixel structure of a liquid crystal display, the pixel structure comprising:
a thin film transistor on an active area of a substrate, the thin film transistor comprises:
an active stack composed of a metal light-shielding layer, a dielectric layer and a silicon island, wherein the metal light-shielding layer, the dielectric layer and the silicon island have the same pattern, and the silicon island has source and drain on two ends thereof;
a gate dielectric layer on the active stack; and
at least a gate on the gate dielectric layer over the active stack;
a storage capacitor, having a first electrode, a capacitive dielectric layer and a second electrode from bottom to top, on a capacitive area of the substrate, wherein the first electrode and the metal light-shielding layer are discontinuous and separated from each other and are made of a first metal layer, the capacitive dielectric layer and the dielectric layer are discontinuous and separated from each other and are made of a first dielectric layer, the second electrode and the silicon island are made of a same single silicon layer and are discontinuous and separated from each other, and the second electrode is a heavily doped silicon layer and connects the drain;
a scan line electrically connecting the gate;
a second dielectric layer over the gate dielectric layer, the gate and the scan line;
a data line on the second dielectric layer;
a first conductive line on the second dielectric layer and connecting the data line and the source; and
a second conductive line on the second dielectric layer and connecting the second electrode to the drain; and
a pixel electrode connecting the second conductive line.
12. The pixel structure of claim 11 , further comprising two lightly doped regions between the source and the drain.
13. The pixel structure of claim 11 , further comprising:
a capacitive line stack electrically connecting the storage capacitor, wherein the structure of the capacitive line stack is the same as the structure of the storage capacitor;
a first terminal at an end of the capacitive line stack, wherein the first terminal is made of the first metal layer; and
a protective layer on the first terminal, the protective layer and the pixel electrode being made of a same transparent conductive layer.
14. The pixel structure of claim 13 , further comprising a second terminal on an end of the scan line and a third terminal on an end of the data line.
15. The pixel structure of claim 14 , wherein the scan line, the gate, and the second terminal are made of a second metal layer, and the data line, the first conductive line, the second conductive line and the third terminal are made of a third metal layer.
16. The pixel structure of claim 11 , wherein a portion of the scan line locates on the active stack.
17. The pixel structure of claim 11 , wherein the silicon layer is made from polysilicon or amorphous silicon.
18. The pixel structure of claim 11 , wherein the first and the second dielectric layer are made from a material comprises silicon oxide.
19. The pixel structure of claim 13 , wherein the transparent conductive layer is made from indium tin oxide, indium zinc oxide, or aluminum zinc oxide.Join the waitlist — get patent alerts
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