S-parameter measurement

Abstract

The invention provides for a method of using a network analyzer and a test controller for measuring S-parameters of a device, which can assume a plurality of states, and which can switch very fast from one state to another. The test controller sends a trigger to the analyzer, which starts a frequency sweep when it receives this trigger. The frequency sweep, having substantially the same start and stop frequency, is provided to the device. The analyzer then executes a measurement of at least one S-parameter of the device, stores the S-parameter data from the measurement and provides the test controller with a trigger. The test controller then updates the device to the next state in a predetermined sequence of states when it receives the trigger from the analyzer. These steps are repeated until all states in the predetermined sequence of states have been measured. In addition, the invention provides for a system for measuring at least one S-parameter of a microwave device, which system comprises a test controller a network analyzer and the microwave device itself.

1. A method of using a network analyzer and a test controller to measure at least one scattering parameter (S-parameter) of a device that rapidly switches through a plurality of states, said method comprising the steps of:
 (a) sending a first trigger from the test controller to the analyzer; 
 (b) performing a frequency sweep of the device by the analyzer when the analyzer receives the first trigger from the test controller, said frequency sweep having substantially the same start and stop frequency; 
 (c) measuring by the analyzer, at least one S-parameter of the device; 
 (d) sending a second trigger from the analyzer to the test controller, said second trigger causing the test controller to step the device to a next state in a predefined sequence of states, if a next state exists; and 
 (e) iteratively repeating steps (a) through (d) until S-parameters have been measured for all of the states in the predetermined sequence of states. 
 
   
   
     2. The method according to  claim 1 , wherein the step of measuring at least one S-parameter includes executing a vector measurement of at least one S-parameter of the device. 
   
   
     3. The method according to  claim 1 , further comprising transferring from the analyzer to the test controller, the measured S-parameters for all of the states in the predetermined sequence of states. 
   
   
     4. The method according to  claim 3 , wherein the measured S-parameters for all of the states in the predetermined sequence of states are transferred to the test controller via a local area network. 
   
   
     5. A system for measuring at least one scattering parameter (S-parameter) of a device that rapidly switches through a plurality of states, said system comprising:
 a test controller; and 
 an analyzer in communication with the test controller; 
 wherein the test controller is adapted to send a first trigger to the analyzer; and 
 the analyzer is adapted to:
 perform a frequency sweep of the device in response to receiving the first trigger from the test controller, said frequency sweep having substantially the same start and stop frequency; 
 measure at least one S-parameter of the device; and 
 send a second trigger to the test controller, said second trigger causing the test controller to step the device to a next state in a predefined sequence of states, if a next state exists, and to send another trigger to the analyzer; 
 
 wherein the test controller and analyzer are adapted to iteratively repeat S-parameter measurements for different states of the device until S-parameters have been measured for all of the states in the predetermined sequence of states. 
 
   
   
     6. The system according to  claim 5 , wherein the analyzer is adapted to execute a vector measurement of at least one S-parameter of the device. 
   
   
     7. The system according to  claim 5 , wherein the analyzer includes means for transferring to the test controller, the measured S-parameters for all of the states in the predetermined sequence of states. 
   
   
     8. The system according to  claim 7 , further comprising a local area network for transferring the measured S-parameters from the analyzer to the test controller.