US7553746B2ExpiredUtilityA1
Method for manufacturing electrodes on a semiconducting material of type II-VI or on a compound of this material
Assignee: COMMISSARIAT ENERGIE ATOMIQUEPriority: Sep 20, 2002Filed: Sep 19, 2003Granted: Jun 30, 2009
Est. expirySep 20, 2022(expired)· nominal 20-yr term from priority
Inventors:Gerard Petroz
H10P 14/47H10F 77/206H10F 71/125H10F 30/29Y02E10/543
35
PatentIndex Score
0
Cited by
8
References
12
Claims
Abstract
A method for manufacturing electrodes on a semiconducting material of type II-VI or on a compound of this material. The electrodes are preferably in gold or platinum and are formed by electrochemical deposition of gold or platinum from a solution of gold or platinum chloride in pure hydrochloric acid.
Claims
exact text as granted — not AI-modified1. A method for manufacturing at least one electrode on a II-VI semiconducting material or a compound of the II-VI semiconductor material, the at least one electrode being in a metal for which the work function is substantially equal to or larger than that of the II-VI semiconducting material, this method being characterized in that the at least one electrode is formed by electrochemical deposition of the metal from a solution of a metal chloride in pure hydrochloric acid, the metal chloride being a chloride of said metal, and wherein pure hydrochloric acid is the liquid which is obtained by dissolving about 37% to about 38% by weight of hydrogen chloride gas molecules in water, wherein the at least one electrode comprises a layer of the metal having a thickness of about 100 nm to about 150 nm and being capable of withstanding a peeling force larger than about 10 kg/cm 2 .
2. The method according to claim 1 , wherein the metal is gold or platinum and a gold chloride solution or a platinum chloride solution in pure hydrochloric acid is used.
3. The method according to claim 2 , wherein a concentration of gold chloride or platinum chloride in pure hydrochloric acid is less than 5%.
4. The method according to claim 1 , wherein a surface of the II-VI semiconducting material or of the compound of the II-WI semiconductor material is prepared before the deposition in order to make this surface capable of fixing the metal.
5. The method according to claim 4 , wherein the surface of the II-VI semiconducting material or of the compound of the II-WI semiconductor material is chemically etched in a solution comprising hydrochloric acid.
6. The method according to claim 5 , wherein the metal is gold or platinum, a gold or platinum chloride solution in pure hydrochloric acid is used and a solution of bromine and hydrochloric acid is used for the chemical etching.
7. The method according to claim 6 , wherein a solution of bromine and pure hydrochloric acid is used for the chemical etching.
8. The method according to claim 5 , wherein the II-VI semiconducting material or the compound of the II-VI semiconducting material is rinsed in pure hydrochloric acid after chemically etching the surface of the II-VI semiconducting material or of the compound of the II-VI semiconducting material.
9. The method according to claim 1 , wherein the II-VI semiconducting material is CdTe.
10. The method according to claim 9 , wherein the at least one electrode is formed on a compound of CdTe which is selected from CdZnTe, CdTe:Cl, CdTeSe:Cl, CdZnTe:Cl, CdTe:In, CdZnTe:In and CdHgTe.
11. The method according to claim 1 , wherein a concentration of the metal chloride in pure hydrochloric acid is less than 5%.
12. The method according to claim 1 , wherein a rinse of the II-VI semiconducting material or the compound of the II-VI semiconducting material is performed in hydrochloric acid and then in water, after electrochemical deposition of the metal is completed.Join the waitlist — get patent alerts
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