US7453931B2ExpiredUtilityA1
Method for measuring the modulation error of digitally modulated high frequency signals
Est. expiryOct 17, 2021(expired)· nominal 20-yr term from priority
H04L 2027/0024H04L 27/2332H04L 27/3863H04L 2027/0016
52
PatentIndex Score
4
Cited by
18
References
13
Claims
Abstract
A method is described for measuring the modulation error in digital modulated high frequency signal, whose amplitude and/or phase is digitally distorted according to a predetermined function, in particular limited by a given clip factor, in which the signal to be measured is compared with a locally generated reference signal that was generated by taking the predetermined distortion function into account.
Claims
exact text as granted — not AI-modified1. A method for measuring a modulation error, comprising:
receiving a signal having amplitude distortion or phase distortion on a digital side according to a predetermined function, the signal being a digitally modulated high frequency signal;
locally generating an ideal reference signal;
distorting the locally generated, ideal reference signal in accordance with said predetermined function; and
comparing the signal with the distorted, locally generated, ideal reference signal to determine the modulation error.
2. A method according to claim 1 , wherein:
the ideal reference signal is generated locally by calculation, and the predetermined function can be set manually on a measuring device.
3. A method according to claim 1 , wherein:
the amplitude of the signal is limited on the digital side by a predetermined clip factor, and
said predetermined function includes clipping the locally generated ideal reference signal in accordance with the predetermined clip factor.
4. A method according to claim 2 , wherein:
the amplitude of the signal is limited on the digital side by a predetermined clip factor, and
said predetermined function includes clipping the locally generated ideal reference signal in accordance with the predetermined clip factor.
5. A method according to claim 1 , wherein:
said predetermined function includes a soft clipping function entered into a measuring device.
6. A method according to claim 1 , wherein:
said predetermined function includes high frequency signal compression.
7. A measurement device, comprising:
means for receiving a signal having amplitude distortion or phase distortion on a digital side according to a predetermined function, the signal being a digitally modulated high frequency signal;
a signal generator for generating an ideal reference signal;
means for distorting the ideal reference signal in accordance with said predetermined function; and
means for comparing the signal with the distorted, locally generated, ideal reference signal to determine modulation error.
8. A measurement device according to claim 7 , wherein:
the ideal reference signal is generated locally in the measurement device by calculation, and the predetermined function is set manually on the measurement device.
9. A measurement device according to claim 7 , wherein:
the amplitude of the signal is limited on the digital side by a predetermined clip factor, and
said predetermined function includes clipping the locally generated ideal reference signal in accordance with the predetermined clip factor.
10. A measurement device according to claim 8 , wherein:
the amplitude of the signal is limited on the digital side by a predetermined clip factor, and
said predetermined function includes clipping the locally generated ideal reference signal in accordance with the predetermined clip factor.
11. A measurement device according to claim 7 , wherein:
said predetermined function includes a soft clipping function entered into the measurement device.
12. A measurement device according to claim 7 , wherein:
said predetermined function includes high frequency signal compression.
13. A method for measuring a modulation error, comprising:
receiving a signal having amplitude distortion or phase distortion on a digital side according to a predetermined clip factor, the signal being a digitally modulated high frequency signal;
locally generating an ideal reference signal, at a measuring device, by calculation from bits and modulation parameters used for the digital modulation of the signal to be measured;
entering the predetermined clip factor into the measuring device and distorting the locally generated, ideal reference signal in accordance with the predetermined clip factor; and
comparing the signal with the distorted locally generated, ideal reference signal to determine the modulation error.Join the waitlist — get patent alerts
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