US7291890B2ExpiredUtilityA1
Gate dielectric and method
Est. expiryNov 30, 2021(expired)· nominal 20-yr term from priority
H10D 84/0177H10D 84/0181H10D 84/038
86
PatentIndex Score
9
Cited by
2
References
1
Claims
Abstract
A MOSFET structure with high-k gate dielectric layer and silicon or metal gates, amorphizing treatment of the high-k gate dielectric layer as with a plasma or ion implantation.
Claims
exact text as granted — not AI-modified1. An integrated circuit, comprising: a substrate; and gates on gate dielectrics on said substrate, said gate dielectrics comprise an amorphous metal silicate, wherein said amorphous metal silicate is characterized by greater amorphicity at an interface with said gate than at an interface with said substrate.
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