Verticle probe card for attachment within a central corridor of a magnetic field generator

Abstract

A vertical probe card assembly containing a plurality of vertical probe cards is mounted within a central corridor or opening within a magnetic field generator. Each of the vertical probe cards has a multiplicity of probe needles extending downwardly therefrom for electrically contacting test pads of a device under test that is positioned below the magnetic field generator.

We claim:  
     
       1. A probe card comprising: 
       an elongated probe card substrate having opposed ends;  
       a multiplicity of probe needles coupled to one of said opposed ends, said probe needles extending substantially parallel to a horizontal surface of a device under test; and  
       wherein said probe card substrate is disposed so as to extend through a corridor in a magnetic field generator such that said probe card substrate is substantially orthogonal to the horizontal surface of the device under test.  
     
     
       2. The probe card of  claim 1 , wherein said probe needles include first and second opposed ends, said first ends coupled to said probe card substrate and at least a portion of said seconds ends extending substantially orthogonally to the horizontal surface of the device under test.