Apparatus and method for forming a deposited film by means of plasma CVD
Abstract
A film-forming apparatus by means of plasma CVD, comprising at least a vacuum chamber, a power application electrode for introducing a discharging power into said vacuum chamber, and a raw material gas supply means for supplying a film-forming raw material gas into said vacuum chamber, said power application electrode being arranged in said vacuum chamber so as to oppose to a substrate arranged in said vacuum chamber, characterized in that said power application electrode has a reinforcing member or said power application electrode comprises a power application electrode with no reinforcing member which has a thickness which is greater than a distance between said substrate and said power application electrode. A film-forming method using said film-forming apparatus.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1. A film-forming apparatus comprising at least a substantially enclosed vacuum chamber whose inside being capable of being evacuated, a power application electrode for introducing a discharging power into said vacuum chamber, and a raw material gas supply means for supplying a film-forming raw material gas into said vacuum chamber, said power application electrode being arranged in said vacuum chamber so as to oppose to a substrate arranged in said vacuum chamber, wherein a prescribed film-forming raw material gas is supplied into said vacuum chamber through said raw material gas supply means and simultaneously with this, a prescribed discharging power is introduced into said vacuum chamber through said power application electrode to generate a plasma between said power application electrode and said substrate whereby decomposing said film-forming raw material gas to cause deposition of a film on said substrate, characterized in that said power application electrode has a reinforcing member provided along a diagonal line of said power application electrode for preventing said power application electrode from being deformed during the film formation.
2. The film-forming apparatus according to claim 1 , wherein said reinforcing member is provided at a back side of a face of said power application electrode which is opposed to said substrate.
3. The film-forming apparatus according to claim 1 , wherein said reinforcing member has a thickness which is greater than that of said power application electrode.
4. The film-forming apparatus according to claim 1 , wherein said power application electrode is electrically connected to a power source capable of supplying an electric power selected from a group consisting of a D.C. power, a low frequency power with an oscillation frequency in a range of 5 kHz to less than 500 kHz, a high frequency power with an oscillation frequency in a range of 500 kHz to less than 30 MHz, and a VHF power with an oscillation frequency in a range of 30 MHz to about 500 MHz.
5. The film-forming apparatus according to claim 1 , wherein said vacuum chamber is controlled to have an inner pressure of 0.5 mTorr to 10 Torr upon the formation of said film on said substrate.
6. A film-forming apparatus comprising at least a substantially enclosed vacuum chamber whose inside being capable of being evacuated, a power application electrode for introducing a discharging power into said vacuum chamber, and a raw material gas supply means for supplying a film-forming raw material gas into said vacuum chamber, said power application electrode being arranged in said vacuum chamber so as to oppose to a substrate arranged in said vacuum chamber, wherein a prescribed film-forming raw material gas is supplied into said vacuum chamber through said raw material gas supply means and simultaneously with this, a prescribed discharging power is introduced into said vacuum chamber through said power application electrode to generate a plasma between said power application electrode and said substrate whereby decomposing said film-forming raw material gas to cause deposition of the film on said substrate, characterized in that said power application electrode has a portion at an end portion thereof, said portion having a thickness which is greater than an average thickness of said power application electrode.
7. A film-forming apparatus comprising at least a substantially enclosed vacuum chamber whose inside being capable of being evacuated, a power application electrode for introducing a discharging power into said vacuum chamber, and a raw material gas supply means for supplying a film-forming raw material gas into said vacuum chamber, said power application electrode being arranged in said vacuum chamber so as to oppose to a substrate arranged in said vacuum chamber, wherein a prescribed film-forming raw material gas is supplied into said vacuum chamber through said raw material gas supply means and simultaneously with this, a prescribed discharging power is introduced into said vacuum chamber through said power application electrode to generate a plasma between said power application electrode and said substrate whereby decomposing said film-forming raw material gas to cause deposition of the film on said substrate, characterized in that said power application electrode has a portion on a diagonal line of said power application electrode, said portion having a thickness which is greater than an average thickness of said power application electrode.
8. A film-forming apparatus comprising at least a substantially enclosed vacuum chamber whose inside being capable of being evacuated, a power application electrode for introducing a discharging power into said vacuum chamber, and a raw material gas supply means for supplying a film-forming raw material gas into said vacuum chamber, said power application electrode being arranged in said vacuum chamber so as to oppose to a substrate arranged in said vacuum chamber, wherein a prescribed film-forming raw material gas is supplied into said vacuum chamber through said raw material gas supply means and simultaneously with this, a prescribed discharging power is introduced into said vacuum chamber through said power application electrode to generate a plasma between said power application electrode and said substrate whereby decomposing said film-forming raw material gas to cause deposition of the film on said substrate, characterized in that said power application electrode has a reinforcing member and a maximum value (d) of a thickness of a combination of said power application electrode and said reinforcing member attached to said power application electrode is greater than a distance (t) between said power application electrode and said substrate.
9. The film-forming apparatus according to claim 8 , wherein a relationship between said maximum value (d) and said distance (t) satisfies the equation d.t≧400.
10. The film-forming apparatus according to claim 8 , wherein said distance (t) is in a range of 5 mm to 50 mm.
11. A film-forming apparatus comprising at least a substantially enclosed vacuum chamber whose inside being capable of being evacuated, a power application electrode for introducing a discharging power into said vacuum chamber, and a raw material gas supply means for supplying a film-forming raw material gas into said vacuum chamber, said power application electrode being arranged in said vacuum chamber so as to oppose to a substrate arranged in said vacuum chamber, wherein a prescribed film-forming raw material gas is supplied into said vacuum chamber through said raw material gas supply means and simultaneously with this, a prescribed discharging power is introduced into said vacuum chamber through said power application electrode to generate a plasma between said power application electrode and said substrate whereby decomposing said film-forming raw material gas to cause deposition of a film on said substrate, characterized in that said power application electrode has a thickness (d) which is greater than a distance (t) between said substrate and said power application electrode.
12. The film-forming apparatus according to claim 11 , wherein a relationship between said thickness (d) and said distance (t) satisfies the equation d.t≧400.
13. The film-forming apparatus according to claim 11 , wherein said distance (t) is in a range of 5 mm to 50 mm.
14. The film-forming apparatus according to claim 11 , wherein said power application electrode is electrically connected to a power source capable of supplying an electric power selected from a group consisting of a D.C. power, a low frequency power with an oscillation frequency in a range of 5 kHz to less than 500 kHz, a high frequency power with an oscillation frequency in a range of 500 kHz to less than 30 MHz, and a VHF power with an oscillation frequency in a range of 30 MHz to about 500 MHz.
15. The film-forming apparatus according to claim 11 , wherein said vacuum chamber is controlled to have an inner pressure of 0.5 mTorr to 10 Torr upon the formation of said film on said substrate.
16. A film-forming method comprising the steps of arranging a substrate on which a film is to be formed in a substantially enclosed vacuum chamber whose inside being capable of being evacuated of a film-forming apparatus having a power application electrode arranged in said vacuum chamber so as to oppose said substrate and a raw material gas supply means for supplying a film-forming raw material gas into said vacuum chamber, supplying a prescribed film-forming raw material gas into said vacuum chamber through said raw material gas supply means, and simultaneously with this, introducing a prescribed discharging power into said vacuum chamber through said power application electrode to generate a plasma between said power application electrode and said substrate whereby decomposing said film-forming raw material gas to cause deposition of a film on said substrate, wherein said power application electrode has a reinforcing member provided along a diagonal line of said power application electrode for preventing said power application electrode from being deformed during the film formation.
17. The film-forming method according to claim 16 , wherein said reinforcing member is provided at a back side of a face of said power application electrode which is opposed to said substrate.
18. The film-forming method according to claim 16 , wherein said reinforcing member has a thickness which is greater than that of said power application electrode.
19. The film-forming method according to claim 16 , wherein said power application electrode is electrically connected to a power source capable of supplying an electric power selected from a group consisting of a D.C. power, a low frequency power with an oscillation frequency in a range of 5 kHz to less than 500 kHz, a high frequency power with an oscillation frequency in a range of 500 kHz to less than 30 MHz, and a VHF power with an oscillation frequency in a range of 30 MHz to about 500 MHz.
20. The film-forming method according to claim 16 , wherein said vacuum chamber is controlled to have an inner pressure of 0.5 mTorr to 10 Torr upon the formation of said film on said substrate.
21. A film-forming method comprising the steps of arranging a substrate on which a film is to be formed in a substantially enclosed vacuum chamber whose inside being capable of being evacuated of a film-forming apparatus having a power application electrode arranged in said vacuum chamber so as to oppose said substrate and a raw material gas supply means for supplying a film-forming raw material gas into said vacuum chamber, supplying a prescribed film-forming raw material gas into said vacuum chamber through said raw material gas supply means, and simultaneously with this, introducing a prescribed discharging power into said vacuum chamber through said power application electrode to generate a plasma between said power application electrode and said substrate whereby decomposing said film-forming raw material gas to cause deposition of a film on said substrate, wherein said power application electrode has a portion at an end portion thereof, said portion having a thickness which is greater than an average thickness of said power application electrode.
22. A film-forming method comprising the steps of arranging a substrate on which a film is to be formed in a substantially enclosed vacuum chamber whose inside being capable of being evacuated of a film-forming apparatus having a power application electrode arranged in said vacuum chamber so as to oppose said substrate and a raw material gas supply means for supplying a film-forming raw material gas into said vacuum chamber, supplying a prescribed film-forming raw material gas into said vacuum chamber through said raw material gas supply means, and simultaneously with this, introducing a prescribed discharging power into said vacuum chamber through said power application electrode to generate a plasma between said power application electrode and said substrate whereby decomposing said film-forming raw material gas to cause deposition of a film on said substrate, wherein said power application electrode has a portion on a diagonal line of said power application electrode, said portion having a thickness which is greater than an average thickness of said power application electrode.
23. A film-forming method comprising the steps of arranging a substrate on which a film is to be formed in a substantially enclosed vacuum chamber whose inside being capable of being evacuated of a film-forming apparatus having a power application electrode arranged in said vacuum chamber so as to oppose said substrate and a raw material gas supply means for supplying a film-forming raw material gas into said vacuum chamber, supplying a prescribed film-forming raw material gas into said vacuum chamber through said raw material gas supply means, and simultaneously with this, introducing a prescribed discharging power into said vacuum chamber through said power application electrode to generate a plasma between said power application electrode and said substrate whereby decomposing said film-forming raw material gas to cause deposition of a film on said substrate, wherein a maximum value (d) of a thickness of a combination of said power application electrode and said reinforcing member attached to said power application electrode is greater than a distance (t) between said power application electrode and said substrate.
24. The film-forming method according to claim 22 , wherein a relationship between said maximum value (d) and said distance (t) satisfies the equation d.t≧400.
25. The film-forming method according to claim 23 , wherein said distance (t) is in a range of 5 mm to 50 mm.
26. A film-forming method comprising the steps of arranging a substrate on which a film is to be formed in a substantially enclosed vacuum chamber whose inside being capable of being evacuated of a film-forming apparatus having a power application electrode arranged in said vacuum chamber so as to oppose said substrate and a raw material gas supply means for supplying a film-forming raw material gas into said vacuum chamber, supplying a prescribed film-forming raw material gas into said vacuum chamber through said raw material gas supply means, and simultaneously with this, introducing a prescribed discharging power into said vacuum chamber through said power application electrode to generate a plasma between said power application electrode and said substrate whereby decomposing said film-forming raw material gas to cause deposition of a film on said substrate, wherein said power application electrode has a thickness (d) which is greater than a distance (t) between said substrate and said power application electrode.
27. The film-forming method according to claim 26 , wherein a relationship between said thickness (d) and said distance (t) satisfies the equation d.t≧400.
28. The film-forming method according to claim 26 , wherein said distance (t) is in a range of 5 mm to 50 mm.
29. The film-forming method according to claim 26 , wherein said power application electrode is electrically connected to a power source capable of supplying an electric power selected from a group consisting of a D.C. power, a low frequency power with an oscillation frequency in a range of 5 kHz to less than 500 kHz, a high frequency power with an oscillation frequency in a range of 500 kHz to less than 30 MHz, and a VHF power with an oscillation frequency in a range of 30 MHz to about 500 MHz.
30. The film-forming method according to claim 26 , wherein said vacuum chamber is controlled to have an inner pressure of 0.5 mTorr to 10 Torr upon the formation of said film on said substrate.Join the waitlist — get patent alerts
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