US6281565B1ExpiredUtility

Semiconductor device and method for producing the same

Assignee: SONY CORPPriority: Dec 25, 1997Filed: Dec 18, 1998Granted: Aug 28, 2001
Est. expiryDec 25, 2017(expired)· nominal 20-yr term from priority
H10W 15/01H10W 15/00H10W 10/031H10W 10/30H10D 10/421H10D 84/0112H10D 10/051H10D 84/038
31
PatentIndex Score
6
Cited by
3
References
2
Claims

Abstract

A semiconductor device comprising an isolating layer (diffusion layer) having a deep depth which can be produced with improved productivity and a method of the same. The semiconductor device comprises a semiconductor substrate of a first conductivity type; a first diffusion layer of a second conductivity type formed in the semiconductor substrate; a first semiconductor layer formed on the semiconductor substrate; a second diffusion layer of the second conductivity type formed in the first semiconductor layer and connected to the first diffusion layer; and a second semiconductor layer formed on the first semiconductor layer; the second semiconductor layer being electrically isolated from the semiconductor substrate by the first diffusion layer and the second diffusion layer.

Claims

exact text as granted — not AI-modified
What is claimed is:  
     
       1. A semiconductor device comprising: 
       a semiconductor substrate of a first conductivity type;  
       a first diffusion layer of a second conductivity type formed in the semiconductor substrate;  
       a first semiconductor layer formed on the semiconductor substrate;  
       a second diffusion layer of the second conductivity type formed in the first semiconductor layer and connected to the first diffusion layer; and  
       a second semiconductor layer formed on the first semiconductor layer;  
       the second semiconductor layer being electrically isolated from the semiconductor substrate by the first diffusion layer and the second diffusion layer;  
       wherein the first semiconductor layer is a stacked layer of a plurality of semiconductor layers and the second diffusion layer comprises a plurality of diffusion layers of the second conductivity type formed in each of the plurality of semiconductor layers.  
     
     
       2. A semiconductor device comprising: 
       a semiconductor substrate of a first conductivity type;  
       a first diffusion layer of a second conductivity type formed on the semiconductor substrate;  
       a first semiconductor layer formed on the semiconductor substrate;  
       a second diffusion layer of the second conductivity type formed in the first semiconductor layer and connected to the first diffusion layer; and  
       a second semiconductor layer formed on the first semiconductor layer;  
       the second semiconductor layer being electrically isolated from the semiconductor substrate by the first diffusion layer and the second diffusion layer;  
       wherein a bipolar transistor is formed, said bipolar transistor comprising a buried layer of the first conductivity type functioning as a collector region formed at an upper layer of the second diffusion layer, a well of the first conductivity type formed at an upper layer of the buried layer and connected to the buried layer, a base region of the second conductivity type formed in the well, and an emitter region of the first conductivity type formed in the base region.

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