Navigation system for handheld scanner
Abstract
A method and apparatus are provided for efficiently obtaining navigational position of a sensor array based on a correlation between images captured by the sensor array at successive points in time. This is achieved by first acquiring a reference frame through said sensor array, successively acquiring a sample frame through said sensor array. Correlation data representing a relationship between the sample frame and the reference frame is then generated and a displacement of a reference feature contained in both the reference frame and the sample frame is determined based on the correlation data. The correlation surface of the correlation data is modeled as a general two-dimensional Taylor series expansion. The method and apparatus of the present invention can be advantageously employed in a scanning device to provide efficient scheme for obtaining navigational information based on a comparison of image frames captured by a sensor array of the scanning device at successive points in time.
Claims
exact text as granted — not AI-modifiedWe claim:
1. A method for obtaining a navigational position of a sensor array, the method comprising:
acquiring a reference frame through said sensor array;
acquiring a sample frame through said sensor array;
generating correlation data representing a relationship between a reference feature of both the sample frame and the reference frame; and
determining a displacement of the reference feature in the sample frame relative to the reference frame based on the correlation data, wherein a global extremum of a correlation surface of the correlation data modeled as a general two-dimensional Taylor series expansion is used to determine the relative displacement.
2. The method of claim 1 , wherein the general two-dimensional Taylor series expansion is second order.
3. The method of claim 1 , wherein the correlation data further comprises a plurality of correlation coefficients generated using a correlation function.
4. The method of claim 3 , further comprising applying a linear mapping between the correlation coefficients and the two-dimensional Taylor series expansion.
5. The method of claim 3 , wherein the correlation function is a first order function.
6. The method of claim 3 , wherein the correlation function is a second order function.
7. The method of claim 3 , wherein the correlation function is a third order function.
8. The method of claim 1 , wherein determining the displacement of the reference feature further comprises determining values of coefficients of the two-dimensional Taylor-series expansion.
9. The method of claim 8 , further comprising computing a statistical fit of the correlation data to obtain the coefficients of the two-dimensional Taylor series expansion.
10. The method of claim 8 , wherein at least one of the coefficients of the two-dimensional Taylor-series expansion is generated by using the reference frame as the sample frame.
11. The method of claim 1 , wherein determining the displacement of the reference feature further comprises determining components of the displacement based on the values of the coefficients of the two-dimensional Taylor-series expansion.
12. The method of claim 10 , further comprising:
determining whether a precision estimate of the displacement of the reference feature is within a predefined set of predicted values.
13. The method of claim 10 , further comprising:
applying a correction function to the generated values of the displacement between the sample and the reference frames.
14. A scanning device comprising:
at least one sensor array;
a processor; and
a computer program controlling the processor, the computer program comprising instructions for:
acquiring a reference frame through said sensor array;
acquiring a sample frame through said sensor array;
generating correlation data representing a relationship between the sample frame and the reference frame; and
determining a displacement of the reference feature in the sample frame relative to the reference frame based on the correlation data, wherein a global extremum of a correlation surface of the correlation data modeled as a general two-dimensional Taylor series expansion is used to determine the relative displacement.
15. The scanner of claim 14 , wherein the general two-dimensional Taylor series expansion is second order.
16. The scanner of claim 14 , wherein the correlation data further comprises a plurality of correlation coefficients generated using a correlation function.
17. The scanner of claim 16 , further comprising applying a linear mapping between the correlation coefficients and the two-dimensional Taylor series expansion.
18. The scanner of claim 16 , wherein the correlation function is a first order function.
19. The scanner of claim 16 , wherein the correlation function is a second order function.
20. The scanner of claim 16 , wherein the correlation function is a third order function.
21. The scanner of claim 14 , wherein determining the displacement of the reference feature further comprises determining values of coefficients of the two-dimensional Taylor-series expansion.
22. The scanner of claim 21 , further comprising computing a statistical fit of the correlation data to obtain the coefficients of the two-dimensional Taylor series expansion.
23. The scanner of claim 21 , wherein at least one of the coefficients of the two-dimensional Taylor-series expansion is generated by using the reference frame as the sample frame.
24. The scanner of claim 14 , wherein determining the displacement of the reference feature further comprises determining components of the displacement based on the values of the coefficients of the two-dimensional Taylor-series expansion.
25. The scanner of claim 24 , further comprising:
determining whether a precision estimate of the displacement of the reference feature is within a predefined set of predicted values.
26. The scanner of claim 24 , further comprising:
applying a correction function to the generated values of the displacement between the sample and the reference frames.Join the waitlist — get patent alerts
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