Integrated circuit with a configuration assembly

Abstract

The integrated circuit has a functional assembly, such as a memory, and a configuration assembly for configuring the functional assembly. The inputs of the configuration assembly can be connected to the control voltage via at least one integrated switch. On the control side, the switch is connected to an evaluation circuit, which, on the input side, is connected to at least one pad. The evaluation circuit detects a configuration signal present at the pad and converts it into a control signal for the switch.

I claim: 
     
       1. An integrated circuit, comprising: a plurality of pads for contacting the integrated circuit;   a functional assembly of the integrated circuit and a configuration assembly connected to said functional assembly for configuring said functional assembly, said configuration assembly having control inputs for receiving at least one control voltage;   at least one integrated switch connected between said control inputs of said configuration assembly and a control voltage source, said integrated switch having a control side connection;   an evaluation circuit having an input side connected to at least one of said plurality of pads and an output side connected to said control side connection of said switch, said evaluation circuit detecting a configuration signal present at said at least one pad and applying a control signal for said switch.   
     
     
       2. The circuit according to claim 1, wherein said pads are adapted to be contacted by bonding. 
     
     
       3. The circuit according to claim 1, wherein said functional assembly is a memory. 
     
     
       4. The circuit according to claim 1, which comprises a non-volatile memory for storing the control signal connected between said switch and said evaluation circuit. 
     
     
       5. The circuit according to claim 1, wherein said evaluation circuit is adapted to detect and convert an analog input signal. 
     
     
       6. The circuit according to claim 1, wherein said evaluation circuit is connected to a plurality of said pads. 
     
     
       7. The circuit according to claim 1, wherein said switch is a transistor. 
     
     
       8. The circuit according to claim 1, which comprises a flash memory cell for storing the control signal connected between said switch and said evaluation circuit. 
     
     
       9. An integrated circuit device, comprising the circuit according to claim 1, a lead frame having pins contact-connected to said pads, and a housing commonly encapsulating said circuit and said lead frame.