Linear measuring device

Abstract

A device for measuring a linear dimension of a component includes a shaft, a worktable base for supporting one end of the shaft, and an end plate for supporting the other end of the shaft in spaced relation to a surface of the worktable. The device also includes a saddle movable along the shaft between the worktable base and the end plate. The worktable base includes a first support table, and the saddle includes a second support table, co-planar with the first support table. Each support table has a removable measuring pin extending upwardly at an angle substantially normal to the surface of the table. The support tables have a configuration designed to support at least a portion of the component in engagement with a respective measuring pin over a wide range of pin separations. A linear scale measures the linear displacement of the measuring pins and provides an indication of the linear dimension of the component.

What is claimed is: 
     
       1. A linear measuring device for measuring a component, comprising: a first contact member fixed to a base,   a second contact member supported by and movable relative to said base,   selectively detachable and attachable bias means on said second contact member adapted to provide biased engagement of said first and second contact members with a selected dimension of the component, and   a linear scale mounted to and extending along said base to measure the linear displacement of said second contact member with respect to a selected reference point on said linear scale, wherein the linear displacement of said second contact member is selectively identifiable on said linear scale to initially calibrate said linear scale against a standard and provide the selected reference point.   
     
     
       2. A linear measuring device as in claim 1, wherein said contact members comprise measuring pins. 
     
     
       3. A linear measuring device as in claim 1, wherein said second contact member is a saddle, said saddle being linearly movable relative to said base. 
     
     
       4. A linear measuring device as in claim 3, wherein said first contact member is removably attached to said base, and said second contact member is removably attached to said saddle. 
     
     
       5. A linear measuring device as in claim 4, wherein said saddle is slidingly received along a shaft, said shaft being supported by and extending in spaced relation to said base. 
     
     
       6. A linear measuring device as in claim 1, wherein said second contact member is mounted on a saddle, said saddle including contact means cooperating with said linear scale to measure the linear displacement of said second contact member with respect to the reference point on said linear scale. 
     
     
       7. A linear measuring device as in claim 1, wherein the linear displacement of said second contact member is selectively identifiable on said linear scale after initial calibration to measure the linear displacement of said second contact member with respect to the selected reference point and calibrate said linear scale against a selected component to provide a second selected reference point. 
     
     
       8. A linear measuring device for measuring a component, comprising: a first contact member removably attached to a base,   a second contact member removably attached to a saddle, said saddle being slidingly received along a shaft and movable relative to said base, said shaft extending in spaced relation to said base and including selectively attachable and detachable spring bias means, said saddle including means for selectively attaching said saddle to said spring bias means,   selectively detachable and attachable bias means on said second contact member adapted to provide biased engagement of said first and second contact members with a selected dimension of the component, and   a linear scale mounted to and extending along said base to measure the linear displacement of said second contact member with respect to a selected reference point on said linear scale, wherein the linear displacement of said second contact member is selectively identifiable on said linear scale to initially calibrate said linear scale against a standard and provide the selected reference point.   
     
     
       9. A linear measuring device as in claim 8, wherein said spring bias means includes a rod extending co-axially with said shaft, said saddle including attachment means to selectively attach and detach said saddle to said rod. 
     
     
       10. A method for linearly measuring a component, comprising: supporting a standard between or over a first contact member fixed to a base and a second contact member fixed to a saddle and linearly movable relative to said base,   applying a selected bias on said second contact member to provide biased engagement of said first and second contact members with a selected dimension of the standard,   calibrating a linear scale to the linear displacement of said second contact member along said scale to provide a fixed reference point on said scale, and   supporting a selected component between or over said first and second contact members, applying the selected bias on said second contact member to provide biased engagement of said first and second contact members with a selected dimension of the selected component, and measuring the linear displacement of said second contact member along said linear scale with respect to the fixed reference point.   
     
     
       11. A method for linearly measuring a component as in claim 10, further comprising calibrating said linear scale to the linear displacement of said second contact member in engagement with said selected component to provide a second fixed reference point on said scale. 
     
     
       12. A method for linearly measuring a component as in claim 10, wherein the components are at least partially supported on a first support surface and a second support surface, the first contact member removably attached to and extending at an angle substantially perpendicular to the first support surface, and the second member removably attached to and extending at an angle substantially perpendicular to the second support surface. 
     
     
       13. A method for linearly measuring a component, comprising: attaching a first support table to a base and removably attaching a first measuring pin at an angle perpendicular to said first support table, and   attaching a second support table to a saddle linearly movable relative to said base and removably attaching a second measuring pin at an angle perpendicular to said second support table,   supporting a standard between or over said first measuring pin and said second measuring pin, and   applying a selected bias on said second measuring pin to provide biased engagement of said first and second contact members with a selected dimension of the standard,   calibrating a linear scale to the linear displacement of said second measuring pin along said scale to provide a fixed reference point on said scale, and   supporting a selected component between or over said first and second measuring pins, applying the selected bias on said second measuring pin to provide biased engagement of said first and second measuring pins with a selected dimension of the selected component, and measuring the linear displacement of said second measuring pin along said linear scale with respect to the fixed reference point.   
     
     
       14. A method for linearly measuring a component as in claim 13, wherein said first and second support tables each include a measuring pin support assembly, each measuring pin support assembly including a measuring pin bore designed to receive a respective measuring pin, a retaining pin bore extending into said measuring pin bore, and a retaining pin received within said measuring pin bore and adapted to be tightened down within the bore against a respective measuring pin to mount the measuring within the measuring pin bore at an angle perpendicular to the surface of a respective support table. 
     
     
       15. A linear measuring device for measuring a component, comprising: a first table fixed to a base, said first table having a first support surface,   a first contact member mounted to said first table and projecting outwardly from said first table at an angle substantially perpendicular to said first support surface,   a second table supported by and moveable relative to said base, said second table having a second support surface,   a second contact member mounted to said second table and projecting outwardly from said second table at an angle perpendicular to said second support surface, said second surface extending substantially co-planar to said first surface,   said first and second tables including selectively attachable and detachable bias means adapted to provide biased engagement of said first and second contact members with a selected dimension of the component set on said first and second support surfaces, and   means to indicate the linear displacement between said first contact member and said second contact member.   
     
     
       16. A linear measuring device for measuring a component as in claim 15, wherein said linear displacement between said first contact member and said second contact member is indicated on a linear scale. 
     
     
       17. A linear measuring device for measuring a component as in claim 15, wherein the linear displacement between said first contact member and said second contact member is indicated on a dial indicator. 
     
     
       18. A linear measuring device for measuring a component as in claim 15, wherein said first and second tables each include mounting means for said first and second contact members, said mounting means including engagement means to urge and lock said contact members substantially perpendicular to said support tables. 
     
     
       19. A linear measuring device for measuring a component as in claim 18, wherein said engagement means includes a bore and a pin received within said bore, each of said contact members being received within a respective bore and urged and locked substantially perpendicular by a respective pin. 
     
     
       20. A linear measuring device for measuring a component as in claim 19, wherein each of said bores includes a wedge-shaped portion, said wedge-shaped portion being disposed substantially adjacent an opposing side of each of said tables, said pin adapted to urge a respective contact member against said wedge-shaped portion to lock a respective contact member perpendicular to said support tables. 
     
     
       21. A linear measuring device for measuring a component as in claim 20, wherein said wedge-shaped portion of said bores includes sidewalls, said sidewalls extending substantially perpendicular with respect to said tables. 
     
     
       22. A linear measuring device for measuring a component as in claim 15, wherein said first and second contact members comprise measuring pins removably mounted in said first and second tables respectively. 
     
     
       23. A linear measuring device for measuring a component as in claim 15, wherein said first and second tables each include a top surface, a bottom surface substantially parallel to said top surface, and sides, said tables each having a substantially semi-circular portion in top plan view. 
     
     
       24. A linear measuring device for measuring a component as in claim 23, wherein one of said tables includes an adjacent side surface movable relative to an adjacent side surface of the other table, each of said adjacent side surfaces including a first and second radial portion and a third portion interconnecting and substantially perpendicular to said first and second radial portions, each of said contact members mounted substantially adjacent an edge of said third portion on a respective/table. 
     
     
       25. A measuring device for measuring a component, comprising: a first table fixed to a base, said first table having a first support surface;   a first contact member fixed to said first table and projecting outwardly from said first table at an angle substantially perpendicular to said first support surface,   a second table supported by and moveable relative to said base, said second table having a second support surface, and being linearly movable relative to said first table,   a second contact member fixed to said second table and projecting outwardly from said second table at an angle substantially perpendicular to said second support surface,   said first and second tables including bias means adapted to provide biased engagement of said first and second contact members with a selected dimension of the component set on said first and second support surfaces, and   a linear scale attached to said base to measure the linear displacement of said second contact member with respect to a selected reference point on said linear scale,   wherein the linear displacement of said second contact member is selectively identifiable on said linear scale to calibrate said linear scale against a standard and provide the selected reference point.