Test socket for leadless chip carrier

Abstract

A test socket (10) for a leadless chip carrier (13) having a rigid guide frame (21) for holding a resilient connector member (23), and for assuring correct alignment of the chip carrier (13). The assembly is mounted on a printed wiring board (22), and the resilient connector member (23) has a pattern of conductive strips (31) that make contact to the chip carrier (13) at the top, and make contact to the printed wiring board (22) at the bottom. A vacuum is selectively applied to a hole (35) in the printed wiring board (22) to seal the chip carrier (13) against the resilient connector member (23).

What is claimed is: 
     
       1. A socket for an electrical component comprising: a substantially rigid frame having an aperture therein with sloped entry sides in said aperture at the entrance of said aperture for receiving and guiding an electrical component into said aperture, a connector recess at the bottom of said aperture, said aperture having sides above said connector recess so that an electrical component can be smoothly inserted and removed into said aperture by guidance by said sloped entry sides toward said connector recess and out of said aperture without catching on the sides of said aperture;   connector means having a top and having a bottom disposed in said recess in said frame for making connection to the electrical component received in said opening, said connector means being made of an insulating elastomeric material, a pattern of conductor strips disposed on said insulating elastomeric material extending from the top thereof to the bottom thereof, said frame being positioned with respect to said connector means so that an electrical component guided by said aperture in said frame is guided into contact with said conductor strips on said top of said connector means so as to make contact and form a vacuum seal between the electrical component and said connector means;   means for testing the conductors on said bottom of said resilient dielectric connector to test the electrical component in contact with said top of said connector; and   vacuum holding means for urging the electrical component toward said connector means.