Anomaly detection apparatus, method, and program

Abstract

An abnormality detection device according to an embodiment includes a measurement unit that measures a culture state of a sample of a culture target that is a culture target during mass culturing by a mass culturing device and that is fed to a microchannel chip and cultured under a set culture condition, and a detection unit that detects an abnormality in a culture state of a sample of the culture target by comparing an abnormality detection model in which a criterion for determining an abnormality in the culture state indicating that the culture state of the sample of the culture target is different from a normal culture state is defined for each of a plurality of culture conditions, and the culture state measured by the measurement unit for the sample and the set culture condition.

1 . An abnormality detection device comprising:
 a memory device; and   at least one hardware processor configured to:
 measure a culture state of a sample of a culture target that is a culture target during mass culturing by a mass culturing device and that is fed to a microchannel chip and cultured under a set culture condition; and 
 detect an abnormality in the culture state of the sample of the culture target by comparing an abnormality detection model in which a criterion for determining an abnormality in the culture state is defined for each of a plurality of culture conditions, and the culture state measured for the sample and the set culture condition, wherein the criterion for determining the abnormality indicates that the culture state of the sample of the culture target is different from a normal culture state. 
   
     
     
         2 . The abnormality detection device according to  claim 1 , wherein
 the at least one hardware processor is configured to
 measure the culture state of the sample of the culture target which is fed to the microchannel chip and cultured under each of a plurality of kinds of culture conditions, and 
 create, on a basis of the measured culture state, the abnormality detection model in which the criterion for determining the abnormality in the culture state of the sample of the culture target is defined for each of the plurality of kinds of culture conditions. 
   
     
     
         3 . The abnormality detection device according to  claim 1 , wherein
 the culture conditions comprise:
 at least one of a temperature related to a channel of the sample in the microchannel chip, an illuminance with respect to the channel, a hydrogen ion concentration index of the sample, a carbon dioxide partial pressure of the sample, or a nutrient salt concentration of the sample. 
   
     
     
         4 . The abnormality detection device according to  claim 1 , wherein
 a culture state of the sample comprises:
 a specific growth rate, a specific substrate consumption rate, a product specific production rate, or a specific oxygen consumption rate of a sample of a culture target that is fed to the microchannel chip and cultured. 
   
     
     
         5 . An abnormality detection method performed by an abnormality detection device, the abnormality detection method comprising:
 measuring, by at least one hardware processor of the abnormality detection device, a culture state of a sample of a culture target that is a culture target during mass culturing by a mass culturing device and that is fed to a microchannel chip and cultured under a set culture condition; and   detecting, by the at least one hardware processor of the abnormality detection device, an abnormality in the culture state of the sample of the culture target by comparing an abnormality detection model in which a criterion for determining an abnormality in the culture state is defined for each of a plurality of culture conditions, and the culture state measured for the sample and the set culture condition, wherein the criterion for determining the abnormality in the culture state indicates that the culture state of the sample of the culture target is different from a normal culture state.   
     
     
         6 . The abnormality detection method according to  claim 5 , further comprising:
 measuring the culture state of the sample of the culture target which is fed to the microchannel chip and cultured under each of a plurality of kinds of culture conditions, and   
       creating, on a basis of the measured culture state, the abnormality detection model in which the criterion for determining the abnormality in the culture state of the sample of the culture target is defined for each of the plurality of kinds of culture conditions. 
     
     
         7 . The abnormality detection method according to  claim 5 , wherein
 the culture conditions comprise:
 at least one of a temperature related to a channel of the sample in the microchannel chip, an illuminance with respect to the channel, a hydrogen ion concentration index of the sample, a carbon dioxide partial pressure of the sample, or a nutrient salt concentration of the sample. 
   
     
     
         8 . A non-transitory computer-readable medium storing instructions of an abnormality detection processing program, wherein execution of the instructions by at least one hardware processor causes the at least one hardware to perform operations comprising:
 measuring a culture state of a sample of a culture target that is a culture target during mass culturing by a mass culturing device and that is fed to a microchannel chip and cultured under a set culture condition; and   detecting an abnormality in the culture state of the sample of the culture target by comparing an abnormality detection model in which a criterion for determining an abnormality in the culture state is defined for each of a plurality of culture conditions, and the culture state measured for the sample and the set culture condition, wherein the criterion for determining the abnormality in the culture state indicates that the culture state of the sample of the culture target is different from a normal culture state.