Apparatus for determining parameters of an electronic device

Abstract

An apparatus determines parameters of an electronic device using a vector network analyzer. The electronic device is designed for a radar system and configured to be set in any one of a plurality of states. The vector network analyzer is configured to run a test of the electronic device. The apparatus includes a device controller configured to set a state of the electronic device, an analyzer controller configured to send to the vector network analyzer a test trigger signal for triggering the test of the electronic device, and a determination controller configured to determine the parameters based on setting the state of the electronic device, and on triggering the test of the electronic device.

1 . An apparatus for determining parameters of an electronic device using a vector network analyzer, the apparatus comprising:
 a device controller configured to set a state of the electronic device, wherein the electronic device is designed for a radar system and configured to be set in any one of a plurality of states, and wherein the vector network analyzer is configured to run a test of the electronic device;   an analyzer controller configured to send to the vector network analyzer a test trigger signal to trigger the test of the electronic device; and   a determination controller configured to determine the parameters based on setting the state of the electronic device, and on triggering the test of the electronic device.   
     
     
         2 . The apparatus according to  claim 1 , wherein the determination controller is configured to determine the parameters based on running a sequence of tests. 
     
     
         3 . The apparatus according to  claim 1 , wherein the apparatus is configured to be connected to a user interface device, and wherein the determination controller is configured to receive from the user interface device an initiation signal in order to determine the parameters. 
     
     
         4 . The apparatus according to  claim 1 , wherein the electronic device is one of the following:
 a power amplifier,   a low-noise amplifier,   an electronic attenuator,   a phase shifter,   a duplexer, and   a transmission or reception module.   
     
     
         5 . The apparatus according to  claim 1 , wherein the analyzer controller is configured to adapt the test trigger signal to trigger at least one of the following:
 a point test, wherein the vector network analyzer runs a test characterized by one particular AC current frequency or power,   a sweep test, wherein the vector network analyzer runs a test characterized by a particular range of AC current frequencies or power.   
     
     
         6 . The apparatus according to  claim 1 , wherein the analyzer controller is configured to one or more of the following:
 to send, to the vector network analyzer, a setup information for the test,   to send, to the vector network analyzer, a signal for interrupting or resuming the running test,   to receive, from the vector network analyzer, a signal if the vector network analyzer is ready to run the test,   to receive, from the vector network analyzer, a status information about the running test,   to receive, from the vector network analyzer, a confirmation signal for confirming that the vector network analyzer has terminated running the test,   to receive, from the vector network analyzer, result data after the vector network analyzer has terminated running the test.   
     
     
         7 . The apparatus according to  claim 1 , wherein the analyzer controller is configured to receive an analog electric pulse, to perform a sampling of the pulse, and to store data obtained from sampling of the pulse. 
     
     
         8 . The apparatus according to  claim 1 , wherein for the test, an analog electric pulse is provided to the electronic device, and wherein the device controller is configured to modulate the pulse provided to the electronic device. 
     
     
         9 . The apparatus according to  claim 1 , wherein the apparatus is configured to measure a direct current parameter of the electronic device. 
     
     
         10 . The apparatus according to  claim 1 , wherein the analyzer controller is configured to initiate a calibration of the vector network analyzer. 
     
     
         11 . The apparatus according to  claim 1 , wherein the determination controller is configured to detect a type of the electronic device. 
     
     
         12 . The apparatus according to  claim 1 , wherein the apparatus includes a user interface for a user to set the state of the electronic device. 
     
     
         13 . A testing system for determining parameters of an electronic device, the testing system comprising:
 a vector network analyzer configured to run a test of the electronic device, wherein the electronic device is designed for a radar system and configured to be set in any one of a plurality of states;   an apparatus comprising
 a device controller configured to set a state of the electronic device; 
 an analyzer controller configured to send to the vector network analyzer a test trigger signal to trigger the test of the electronic device; and 
 a determination controller configured to determine the parameters based on setting the state of the electronic device, and on triggering the test of the electronic device; and 
   a user interface device configured to setup the vector network analyzer, and to connect to the apparatus.   
     
     
         14 . A method for performing a measurement of parameters of an electronic device using a vector network analyzer, the method comprising:
 setting a state of the electronic device, wherein the electronic device is designed for a radar system and configured to be set in any one of a plurality of states, and wherein the vector network analyzer is configured to run a test of the electronic device;   sending to the vector network analyzer a test trigger signal configured to trigger the test of the electronic device; and   determining the parameters based on setting the state of the electronic device, and on triggering the test of the electronic device.