Rotating probe for formation testing and sampling
Abstract
Probes with sensors can be positioned within a borehole. Certain types of sensor data is collected by placing the sensor against an inside surface of the borehole or casing. To help reduce the impact of fluid, solids, or other material in the borehole from affecting collected sensor data, a seal is used by the probe to separate the casing or subterranean formation from material in the borehole. The probe can be elliptical, rectangular, or other types of non-circular shapes. In some aspects, the probe can be rotated so the collected sensor data can be collected from different orientations improving the resolution of the data collected. In some aspects, the probe can be rotated until a tool-formation quality threshold is satisfied or until a determined or selected seal quality is achieved. The probe can be rotated by a specified number of degrees of rotation and rotate in one or both directions.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . An apparatus, comprising:
a downhole tool, operable to be inserted into a borehole; and a probe, attached to and supported by the downhole tool and operable to rotate a specified number of degrees of rotation with respect to a first inside surface of the borehole.
2 . The apparatus as recited in claim 1 , wherein the probe rotates axially along a connection point to the downhole tool.
3 . The apparatus as recited in claim 1 , wherein the probe comprises one or more sensors capable of collecting data.
4 . The apparatus as recited in claim 1 , wherein the probe rotates a specified number of degrees from an initial position as specified by a probe controller.
5 . The apparatus as recited in claim 1 , wherein the probe is further operable to form at least a partial fluidic seal with the first inside surface.
6 . The apparatus as recited in claim 1 , wherein the probe utilizes an elliptical shape.
7 . The apparatus as recited in claim 1 , wherein the probe is further operable to form a seal with one of the first inside surface or a second inside surface of a casing.
8 . A system, comprising:
a downhole tool, operable to support one or more probes, wherein the downhole tool is inserted into a borehole; and a probe, operable to be extended from the downhole tool and form at least a partial seal with a first inside surface of the borehole or a second inside surface of a casing, wherein the probe is rotated from an initial position, and the probe includes one or more sensors.
9 . The system as recited in claim 8 , wherein the probe rotates a specified number of degrees.
10 . The system as recited in claim 8 , wherein the one or more sensors measure a fluid pressure, a fluid temperature, a fluid density, or a fluid composition.
11 . The system as recited in claim 8 , wherein the probe is extended from the downhole tool and forms a fluid seal with the first inside surface or the second inside surface.
12 . The system as recited in claim 11 , wherein the probe is rotated a specified number of degrees until a tool-formation quality threshold is satisfied.
13 . The system as recited in claim 12 , wherein the tool-formation quality threshold is not satisfied and a probe controller directs the probe to rotate to a specified degree offset from the initial position.
14 . The system as recited in claim 8 , further comprising,
a probe controller, operable to direct operations of the probe, to analyze collected sensor data, and to communicate the collected sensor data to one or more other computing systems.
15 . The system as recited in claim 14 , wherein the probe controller comprises one or more processors.
16 . The system as recited in claim 14 , wherein the probe controller is part of a surface controller, a well site controller, a reservoir controller, a computing system, or the downhole tool.
17 . The system as recited in claim 14 , wherein the probe controller is operable to direct an adjustment of a borehole operation by directing the operations of downhole tools using the collected sensor data.
18 . A method, comprising:
positioning a probe at a downhole location of a borehole; extending the probe toward a first inside surface of the borehole or a second inside surface of a casing; and rotating the probe to a specified degree offset from an initial position, wherein the probe includes at least one sensor and the sensor is collecting data with respect to the casing or a subterranean formation proximate the probe.
19 . The method as recited in claim 18 , further comprising,
measuring a characteristic quality parameter between the probe and one of the first inside surface or the second inside surface; and rotating the probe a specified number of degrees from a current orientation of the probe when the characteristic quality parameter does not satisfy a tool-formation quality threshold and the probe has available degrees of rotation.
20 . The method as recited in claim 19 , wherein the probe passes through or stops at the initial position, further comprising,
rotating the probe to a determined degree offset from the initial position.
21 . The method as recited in claim 20 , wherein the determined degree offset corresponds to a best seal quality parameter.
22 . The method as recited in claim 20 , wherein a probe controller selects the determined degree offset.Join the waitlist — get patent alerts
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