Assessing display health in response to accidents

Abstract

Systems and methods for assessing display health in response to accidents are described. In some embodiments, an Information Handling System (IHS) may include an Embedded Controller (EC) and a memory coupled to the EC, where the memory comprises program instructions that, upon execution by the EC, cause the IHS to initiate an integrated display's Built-In-Self-Test (BIST) in response to a determination that the IHS suffered an accident.

1 . An Information Handling System (IHS), comprising:
 an Embedded Controller (EC); and   a memory coupled to the EC, wherein the memory comprises program instructions that, upon execution by the EC, cause the IHS to initiate an integrated display's Built-In-Self-Test (BIST) in response to a determination that the IHS suffered an accident.   
     
     
         2 . The IHS of  claim 1 , wherein to determine that the IHS suffered the accident, the EC is configured to check an accident flag or register prior to a reboot of the IHS. 
     
     
         3 . The IHS of  claim 1 , wherein the accident comprises at least one of: a drop, a fall, a throw, a hit, a crash, an impact, or a collision involving the IHS or a component thereof. 
     
     
         4 . The IHS of  claim 1 , wherein the accident takes place while the IHS is in Modern Standby or low-power state. 
     
     
         5 . The IHS of  claim 1 , wherein the program instructions, upon execution by the EC, cause the IHS to enter an S5 state prior to initiation of the BIST. 
     
     
         6 . The IHS of  claim 1 , wherein to initiate the BIST, the program instructions, upon execution by the EC, cause the IHS to communicate with a display controller. 
     
     
         7 . The IHS of  claim 1 , wherein the BIST is configured to measure one or more electrical currents. 
     
     
         8 . The IHS of  claim 7 , wherein the electrical current is indicative of an image noise level. 
     
     
         9 . The IHS of  claim 7 , wherein the BIST is configured to determine, based at least in part upon the measurement, whether the integrated display has suffered damage. 
     
     
         10 . The IHS of  claim 7 , wherein the BIST is configured to identify, based at least in part upon the one or more electrical currents, at least one of: a type of damage, or a severity of the damage. 
     
     
         11 . The IHS of  claim 1 , wherein the program instructions, upon execution by the EC, further cause the IHS to identify the type or severity of the damage based, at least in part, upon a policy. 
     
     
         12 . The IHS of  claim 1 , wherein the program instructions, upon execution by the EC, further cause the IHS to identify the type or severity of the damage based, at least in part, upon execution of an Artificial Intelligence (AI) or Machine Learning (ML) model. 
     
     
         13 . A memory device having program instructions stored thereon that, upon execution by a processor of an Information Handling System (IHS), cause the IHS to:
 determine that the IHS suffered an accident; and   initiate an integrated display's Built-In-Self-Test (BIST), at least in part, in response to the determination.   
     
     
         14 . The memory device of  claim 13 , wherein to determine that the IHS suffered an accident, the program instructions, upon execution, cause an Operating System (OS) to receive an indication of the accident from an Embedded Controller (EC). 
     
     
         15 . The memory device of  claim 13 , wherein the indication comprises an Advanced Configuration and Power Interface (ACPI) table or command. 
     
     
         16 . The memory device of  claim 13 , wherein an Operating System (OS) of the IHS is configured to run a display diagnostics routine based, at least in part, upon the indication. 
     
     
         17 . A method, comprising:
 receiving an instruction, at a Liquid Crystal Display (LCD) controller from an Embedded Controller (EC) within an Information Handling System (IHS), to perform a Built-In-Self-Test (BIST) in response to an accident; and   providing a result of the BIST to the EC.   
     
     
         18 . The method of  claim 17 , wherein the BIST is configured to measure an image noise level of an LCD display coupled to the IHS. 
     
     
         19 . The method of  claim 18 , wherein the BIST is configured to determine, based at least in part upon the measurement, whether the LCD display has suffered damage. 
     
     
         20 . The method of  claim 19 , wherein the BIST is configured to determine whether the LCD display has a cracked screen.