Apparatus and method for controlling and debugging hardware lockstep mis-compares
Abstract
An apparatus and method for controlling and debugging hardware lockstep mis-compares. For example, one embodiment of a processor comprises: a plurality of processing elements operable in a redundancy mode, the plurality of processing elements to each execute a same plurality of instructions and produce a corresponding plurality of result signals; comparator circuitry to compare corresponding result signals of the plurality of result signals, the comparator circuitry to generate one or more failure indications when a first one or more result signals produced by a first processing element are different from a corresponding second one or more result signals produced by a second processing element; and masking circuitry to mask a first failure indication of the one or more failure indications when a corresponding mask bit of a mask matrix is set to a first value.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A processor, comprising:
a plurality of processing elements operable in a redundant processing mode, each processing element of the plurality of processing elements to execute an identical plurality of instructions and produce a corresponding plurality of result signals; comparator circuitry to compare corresponding result signals of the corresponding plurality of result signals, the comparator circuitry to generate one or more failure indications when a first one or more result signals produced by a first processing element differ from a corresponding second one or more result signals produced by a second processing element; and masking circuitry to mask a first failure indication of the one or more failure indications when a corresponding mask bit of a mask matrix is set to a first value.
2 . The processor of claim 1 wherein the mask matrix is generated based on a combination of signal-level mask bits and group-level mask bits.
3 . The processor of claim 2 wherein the comparator circuitry comprises a plurality of comparators, each comparator of the plurality of comparators configured to perform comparisons of a group of result signals of the corresponding plurality of result signals, each group of result signals associated with a group-level mask bit of a plurality of group-level mask bits.
4 . The processor of claim 3 wherein each group of result signals includes result signals of a particular type.
5 . The processor of claim 3 wherein each group of result signals includes result signals associated with a separate key characteristic indicator of the plurality of processing elements.
6 . The processor of claim 3 wherein the corresponding mask bit of the mask matrix is set to the first value only when a corresponding signal level mask bit of a plurality of signal level mask bits and a corresponding group-level mask bit of the plurality of group-level mask bits are both set to the first value.
7 . The processor of claim 6 wherein the first value comprises a binary value of 1.
8 . The processor of claim 1 wherein the masking circuitry is to mask the first failure indication by changing the first failure indication to a pass indication.
9 . The processor of claim 3 wherein the plurality of group-level mask bits and the signal-level mask bits are to be used to identify a source of the one or more failure indications.
10 . A method comprising:
operating a plurality of processing elements in a redundant processing mode, each processing element of the plurality of processing elements to execute an identical plurality of instructions and produce a corresponding plurality of result signals; comparing corresponding result signals of the corresponding plurality of result signals; generating one or more failure indications when a first one or more result signals produced by a first processing element differ from a corresponding second one or more result signals produced by a second processing element; and masking a first failure indication of the one or more failure indications when a corresponding mask bit of a mask matrix is set to a first value.
11 . The method of claim 10 further comprising:
generating the mask matrix based on a combination of signal-level mask bits and group-level mask bits.
12 . The method of claim 11 wherein comparing is performed with a plurality of comparators, each comparator of the plurality of comparators configured to perform comparisons of a group of result signals of the corresponding plurality of result signals, each group of result signals associated with a group-level mask bit of a plurality of group-level mask bits.
13 . The method of claim 12 wherein each group of result signals includes result signals of a particular type.
14 . The method of claim 12 wherein each group of result signals includes result signals associated with a separate key characteristic indicator of the plurality of processing elements.
15 . The method of claim 12 wherein the corresponding mask bit of the mask matrix is set to the first value only when a corresponding signal level mask bit of a plurality of signal-level mask bits and a corresponding group-level mask bit of the plurality of group-level mask bits are both set to the first value.
16 . The method of claim 15 wherein the first value comprises a binary value of 1.
17 . The method of claim 10 wherein masking the first failure indication includes changing the first failure indication to a pass indication.
18 . The method of claim 12 further comprising:
identifying a source of the one or more failure indications based on the plurality of group-level mask bits and the signal-level mask bits.
19 . A machine-readable medium having program code stored thereon which, when executed by a machine, causes the machine to perform operations, comprising:
operating a plurality of processing elements in a redundant processing mode, each processing element of the plurality of processing elements to execute an identical plurality of instructions and produce a corresponding plurality of result signals; comparing corresponding result signals of the corresponding plurality of result signals; generating one or more failure indications when a first one or more result signals produced by a first processing element differ from a corresponding second one or more result signals produced by a second processing element; and masking a first failure indication of the one or more failure indications when a corresponding mask bit of a mask matrix is set to a first value.
20 . The machine-readable medium of claim 19 further comprising program code to cause the machine to perform the operation of:
generating the mask matrix based on a combination of signal-level mask bits and group-level mask bits.Join the waitlist — get patent alerts
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