Anti-dry heating method, atomization driving circuit, electronic atomization apparatus, and related apparatus

Abstract

An anti-dry heating method for an electronic atomization apparatus includes: obtaining a first temperature change parameter corresponding to an atomization element within a suction time period, and obtaining a first overtemperature threshold corresponding to the atomization element, the first temperature change parameter being related to a temperature change trend of the atomization element within the suction time period; and performing a corresponding operation in response to the first temperature change parameter being greater than the first overtemperature threshold within the suction time period.

What is claimed is: 
     
         1 . An anti-dry heating method for an electronic atomization apparatus, the method comprising:
 obtaining a first temperature change parameter corresponding to an atomization element within a suction time period, and obtaining a first overtemperature threshold corresponding to the atomization element, the first temperature change parameter being related to a temperature change trend of the atomization element within the suction time period; and   performing a corresponding operation in response to the first temperature change parameter being greater than the first overtemperature threshold within the suction time period.   
     
     
         2 . The method of  claim 1 , wherein obtaining a first temperature change parameter corresponding to an atomization element within a suction time period comprises:
 obtaining a first detection value corresponding to the atomization element at a first moment within a current suction time period, obtaining a second detection value corresponding to the atomization element at a second moment within the current suction time period, and determining a first detection reference value corresponding to the atomization element within the current suction time period based on the first detection value and the second detection value; and   obtaining a second detection reference value corresponding to the atomization element within a suction learning time period, and determining the first temperature change parameter corresponding to the atomization element within the current suction time period based on the first detection reference value and the second detection reference value,   wherein the suction learning time period occurs before the suction time period.   
     
     
         3 . The method of  claim 2 , wherein obtaining a second detection reference value corresponding to the atomization element within the suction learning time period comprises:
 obtaining, in response to a quantity of a first quantity of reference suction time periods within the suction learning time period being greater than a first threshold, a first quantity of second detection reference values corresponding to the atomization element within the first quantity of reference suction time periods; and   selecting, from the first quantity of second detection reference values, a second quantity of relatively large second detection reference values, calculating a first average value, and using the first average value as the second detection reference value corresponding to the atomization element within the suction learning time period,   wherein the second quantity is less than or equal to the first quantity.   
     
     
         4 . The method of  claim 3 , wherein obtaining the second detection reference value corresponding to the atomization element within each of the reference suction time periods comprises:
 obtaining a third detection value corresponding to the atomization element at a third moment within each reference suction time period, obtaining a fourth detection value corresponding to the atomization element at a fourth moment within each reference suction time period, and determining the second detection reference value corresponding to the atomization element within each reference suction time period based on the third detection value and the fourth detection value.   
     
     
         5 . The method of  claim 1 , wherein, before obtaining a first temperature change parameter corresponding to an atomization element within the suction time period, and obtaining the first overtemperature threshold corresponding to the atomization element, the method further comprises:
 detecting whether an atomizable medium exists in an atomizer in the electronic atomization apparatus; and   performing a corresponding operation in response to no atomizable medium existing in the atomizer.   
     
     
         6 . The method of  claim 5 , wherein detecting whether the atomizable medium exists in the atomizer in the electronic atomization apparatus comprises:
 obtaining a fifth detection value corresponding to a fifth moment within a suction triggering time period and a sixth detection value corresponding to a sixth moment within the suction triggering time period, the suction triggering time period occurring before the suction learning time period;   determining a first overtemperature determining parameter corresponding to the atomization element within the suction triggering time period based on the fifth detection value and the sixth detection value; and   determining, in response to the first overtemperature determining parameter corresponding to the atomization element being greater than a second overtemperature threshold within the suction triggering time period, that no atomizable medium exists in the atomizer.   
     
     
         7 . The method of  claim 6 , wherein detecting whether the atomizable medium exists in the atomizer in the electronic atomization apparatus comprises:
 determining, in response to the atomizable medium existing in the atomizer and a quantity of the first quantity of reference suction time periods being less than or equal to a first threshold, whether a second temperature change parameter corresponding to the atomization element within the suction learning time period is greater than the first overtemperature threshold, and determining whether a second overtemperature determining parameter corresponding to the atomization element within the suction learning time period is greater than a third overtemperature threshold; and   determining, in response to the second temperature change parameter corresponding to the atomization element within the suction learning time period being greater than the first overtemperature threshold, and the second overtemperature determining parameter corresponding to the atomization element within the suction learning time period being greater than the third overtemperature threshold, that the atomizable medium exists in the atomizer and is consumed within the suction learning time period.   
     
     
         8 . The method of  claim 7 , wherein determining the second temperature change parameter corresponding to the atomization element within the suction learning time period comprises:
 obtaining a first quantity of third detection reference values corresponding to the atomization element within the first quantity of reference suction time periods within the suction learning time period;   selecting, from the first quantity of third detection reference values, a maximum of the third detection reference values as the third detection reference value corresponding to the atomization element within the suction learning time period;   obtaining a seventh detection value corresponding to the atomization element at a seventh moment within a current reference suction time period and an eighth detection value corresponding to the atomization element at an eighth moment within the current reference suction time period, and determining a fourth detection reference value corresponding to the atomization element within a current suction learning time period based on the seventh detection value and the eighth detection value; and   determining the second temperature change parameter corresponding to the atomization element within the suction learning time period based on the third detection reference value and the fourth detection reference value.   
     
     
         9 . The method of  claim 7 , wherein determining the second overtemperature determining parameter corresponding to the atomization element within the suction learning time period comprises:
 obtaining a temperature corresponding to the atomization element at a different moment within one of the reference suction time periods within the suction learning time period; and   determining the second overtemperature determining parameter corresponding to the atomization element within the suction learning time period based on the temperature corresponding to the atomization element at the different moment.   
     
     
         10 . The method of  claim 2 , wherein, after obtaining the second detection reference value corresponding to the atomization element within the suction learning time period, the method further comprises:
 using the second detection reference value corresponding to the atomization element obtained within the suction learning time period as a current second detection reference value; and   calculating, in response to a difference between an initial resistance value of the atomization element that is sampled and a minimum resistance value of the atomization element that is obtained within the current suction time period being greater than a second threshold, a second average value of the current second detection reference value and the second detection reference value of the atomization element within the current suction time period, and using the second average value as the second detection reference value within a next suction time period.   
     
     
         11 . The method of  claim 1 , wherein, before the electronic atomization apparatus is used, the method further comprises:
 detecting whether the atomizer in the electronic atomization apparatus is reliably connected to a power supply; and   obtaining the first temperature change parameter corresponding to the atomization element within the suction time period in response to the atomizer being reliably connected to the power supply.   
     
     
         12 . The method of  claim 11 , wherein detecting whether the atomizer in the electronic atomization apparatus is reliably connected to the power supply comprises:
 connecting the atomizer to the power supply, and sampling a resistance value of the atomization element in the atomizer so as to obtain a detection value corresponding to the resistance value of the atomization element; and   calculating a third average value of a third quantity of detection values that are obtained, and determining, in response to a difference between each of the third quantity of detection values that are obtained and the third average value being less than or equal to a third threshold, that the atomizer is reliably connected to the power supply.   
     
     
         13 . The method of  claim 12 , further comprising:
 determining, in response to the difference between at least one of the third quantity of detection values that are obtained the first time and the third average value being greater than the third threshold, and a number of times a difference between at least one of the third quantity of detection values that are subsequently obtained each time and the third average value corresponding to the at least one detection value is greater than the third threshold being greater than a fourth threshold, that the atomizer is unreliably connected to the power supply.   
     
     
         14 . The method of  claim 12 , wherein, before sampling the resistance value of the atomization element in the atomizer, the method further comprises:
 connecting the atomizer to the power supply, waiting for a first preset time, and sampling the resistance value of the atomization element in the atomizer after the first preset time.   
     
     
         15 . An atomization driving circuit for an electronic atomization apparatus, comprising:
 a driving module comprising an atomization element, the driving module being configured to heat an atomizable medium; and   a control module connected to the driving module and configured to obtain a first temperature change parameter corresponding to the atomization element within a suction time period, and obtain a first overtemperature threshold corresponding to the atomization element,   wherein the control module is configured to perform a corresponding operation in response to the first temperature change parameter being greater than the first overtemperature threshold within the suction time period.   
     
     
         16 . The atomization driving circuit of  claim 15 , wherein the control module comprises a collection module and a control chip,
 wherein the collection module is configured to collect a first detection value corresponding to the atomization element at a first moment within a current suction time period, and collect a second detection value corresponding to the atomization element at a second moment within the current suction time period, and the control chip is configured to determine a first detection reference value corresponding to the atomization element within the current suction time period based on the first detection value and the second detection value,   wherein the collection module is configured to collect a third detection value corresponding to the atomization element at a third moment within each reference suction time period, and obtain a fourth detection value corresponding to the atomization element at a fourth moment within each reference suction time period, and the control chip is configured to determine a second detection reference value corresponding to the atomization element within each reference suction time period based on the third detection value and the fourth detection value, and   wherein the control chip is configured to determine the first temperature change parameter corresponding to the atomization element within the suction time period based on the first detection reference value and the second detection reference value corresponding to the atomization element within a suction learning time period, the suction learning time period occurring before the suction time period, and the second detection reference value corresponding to the atomization element within the suction learning time period is determined based on the second detection reference value corresponding to the atomization element within each reference suction time period.   
     
     
         17 . An electronic atomization apparatus, comprising:
 a memory configured to store program instructions; and   a processor configured to retrieve the program instructions from the memory to perform the anti-dry heating method of  claim 1 .   
     
     
         18 . A computer-readable storage medium configured to store a control program, wherein the control program, when executed by a processor, is configured to implement the anti-dry heating method of  claim 1 .