US2024319221A1PendingUtilityA1

Automatic analysis device and method for controlling same

Assignee: HITACHI HIGH TECH CORPPriority: Jan 6, 2021Filed: Oct 22, 2021Published: Sep 26, 2024
Est. expiryJan 6, 2041(~14.5 yrs left)· nominal 20-yr term from priority
G01N 2035/00277G01N 2035/1048G01N 21/75G01N 21/51G01N 21/253G01N 35/1009
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Claims

Abstract

Provided are an automatic analysis device capable of suppressing the mixing in of a suspended matter in an upper layer sample to be dispensed from a specimen container to a reaction container; and a method for controlling the automatic analysis device. The automatic analysis device analyzes a specimen and comprises a specimen dispensing probe that dispenses the upper layer sample of a specimen which has been separated into the upper layer sample and a lower layer sample, from a specimen container containing the specimen to a reaction container; and a control unit that controls the operation of the specimen dispensing probe. The control unit causes the specimen dispensing probe to remove part of the surface layer of the upper layer sample and/or apply vibrations to the surface layer of the upper layer sample and then dispense the upper layer sample from the specimen container to the reaction container.

Claims

exact text as granted — not AI-modified
1 . An automatic analysis device for analyzing a specimen, comprising:
 a specimen dispensing probe configured to dispense an upper layer sample of a specimen, that is separated into the upper layer sample and a lower layer sample, from a specimen container storing the specimen into a reaction container; and   a control unit configured to control an operation of the specimen dispensing probe, wherein   the control unit causes the specimen dispensing probe to remove a part of a surface layer of the upper layer sample or apply a vibration to the surface layer of the upper layer sample, and then dispense the upper layer sample from the specimen container to the reaction container for a specific test.   
     
     
         2 . The automatic analysis device according to  claim 1 , wherein
 the control unit causes the specimen dispensing probe to remove the upper layer sample of an amount exceeding a threshold value from the surface layer, and then dispense the upper layer sample for the specific test.   
     
     
         3 . The automatic analysis device according to  claim 2 , wherein
 the threshold value is set based on a depth of a suspended matter floating in the surface layer of the upper layer sample and an inner diameter of the specimen container.   
     
     
         4 . The automatic analysis device according to  claim 2 , wherein
 the part of the upper layer sample removed from the surface layer is used for a test other than the specific test.   
     
     
         5 . The automatic analysis device according to  claim 1 , wherein
 the specific test is measurement of a lactate dehydrogenase or an alkaline phosphatase.   
     
     
         6 . The automatic analysis device according to  claim 1 , wherein
 the control unit causes the specimen dispensing probe to repeat aspirating and discharging with respect to the surface layer so as to apply a vibration to the surface layer, and then dispense the upper layer sample for the specific test.   
     
     
         7 . The automatic analysis device according to  claim 1 , wherein
 the control unit causes the specimen dispensing probe to repeat lowering and raising to come into contact with the surface layer a plurality of times so as to apply a vibration to the surface layer, and then dispense the upper layer sample for the specific test.   
     
     
         8 . A method for controlling an automatic analysis device for analyzing a specimen, the method comprising:
 causing a specimen dispensing probe, configured to dispense an upper layer sample of a specimen, that is separated into the upper layer sample and a lower layer sample, from a specimen container storing the specimen into a reaction container, to remove a part of a surface layer of the upper layer sample or apply a vibration to the surface layer of the upper layer sample, and then dispense the upper layer sample from the specimen container to the reaction container for a specific test.

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