US2024110897A1PendingUtilityA1

Polymer Analysis Apparatus and Method

Assignee: JEOL LTDPriority: Sep 29, 2022Filed: Sep 28, 2023Published: Apr 4, 2024
Est. expirySep 29, 2042(~16.2 yrs left)· nominal 20-yr term from priority
G01N 30/72G01N 30/8631G16C 20/20G16C 20/80
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Claims

Abstract

A second polymer is prepared through derivatization of a first polymer. Kendrick Mass Defect (KMD) analysis is applied on a mass spectrum of the second polymer, to thereby produce a plot. Meanwhile, a plurality of mass candidates for a non-primary-chain segment are calculated based on a mass spectrum of the first polymer. The KMD analysis is applied on the plurality of mass candidates, to thereby produce reference images. A mass of the non-primary-chain segment is identified through matching of two KMD analysis results.

Claims

exact text as granted — not AI-modified
1 . A polymer analysis apparatus comprising:
 a processor configured to process a first mass spectrum of a first polymer, and a second mass spectrum of a second polymer having a non-primary-chain segment which is identical to a non-primary-chain segment of the first polymer, wherein   the processor is configured to:   calculate at least one mass candidate for the non-primary-chain segment based on a first polymer molecule mass and a first repeating unit mass identified from the first mass spectrum;   apply Kendrick Mass Defect (KMD) analysis on the at least one mass candidate using the first repeating unit mass, to thereby produce a first KMD analysis result;   apply KMD analysis on the second mass spectrum using a second repeating unit mass identified from the second mass spectrum, to thereby produce a second KMD analysis result; and   produce an image for identifying a mass of the non-primary-chain segment or judge the mass of the non-primary-chain segment based on the first KMD analysis result and the second KMD analysis result.   
     
     
         2 . The polymer analysis apparatus according to  claim 1 , wherein
 the processor is further configured to:   produce a plot representing the second KMD analysis result; and   produce a reference image representing the first KMD analysis result, which is to be added to the plot.   
     
     
         3 . The polymer analysis apparatus according to  claim 2 , wherein
 the plot includes at least one of an NKM-KMD plot having a Nominal Kendrick Mass (NKM) axis and a KMD axis, or an RKM-KMD plot having a Remainder of Kendrick Mass (RKM) axis and the KMD axis.   
     
     
         4 . The polymer analysis apparatus according to  claim 3 , wherein
 the processor is further configured to calculate a plurality of mass candidates for the non-primary-chain segment, and   the reference image includes at least one of a first reference image including a plurality of figures representing a plurality of KMDs calculated from the plurality of mass candidates and displayed on the NKM-KMD plot, or a second reference image including a plurality of figures representing a plurality of sets of RKM-KMDs calculated from the plurality of mass candidates and displayed on the RKM-KMD plot.   
     
     
         5 . The polymer analysis apparatus according to  claim 1 , wherein
 the processor is further configured to: calculate a plurality of mass candidates by repeating subtraction of the first repeating unit mass from the first polymer molecule mass.   
     
     
         6 . The polymer analysis apparatus according to  claim 5 , wherein
 the processor is further configured to: determine, when a remaining mass after subtraction belongs in a mass range which is designated, the remaining mass as a mass candidate.   
     
     
         7 . The polymer analysis apparatus according to  claim 5 , wherein
 the processor is further configured to: repeat calculation of a degree of polymerization along with repetition of the subtraction, to thereby create a list in which the plurality of mass candidates and a plurality of degrees of polymerization corresponding thereto are registered.   
     
     
         8 . The polymer analysis apparatus according to  claim 1 , wherein
 the processor is further configured to: calculate a total ionic strength for each calculated KMD based on the second mass spectrum, to thereby create a graph representing a plurality of total ionic strengths corresponding to a plurality of KMDs.   
     
     
         9 . The polymer analysis apparatus according to  claim 1 , wherein
 one of the first polymer and the second polymer is a polymer before derivatization, and   the other of the first polymer and the second polymer is a polymer after derivatization.   
     
     
         10 . A method of analyzing a polymer, the method comprising:
 calculating, based on a first polymer molecule mass and a first repeating unit mass identified from a first mass spectrum of a first polymer, at least one mass candidate for a non-primary-chain segment of the first polymer;   applying Kendrick Mass Defect (KMD) analysis on the at least one mass candidate using the first repeating unit mass, to thereby produce a first KMD analysis result;   applying KMD analysis on a second mass spectrum of a second polymer having a non-primary-chain segment which is identical to the non-primary-chain segment of the first polymer, using a second repeating unit mass identified from the second mass spectrum, to thereby produce a second KMD analysis result; and   producing an image for identifying a mass of the non-primary-chain segment or judging the mass of the non-primary-chain segment based on the first KMD analysis result and the second KMD analysis result.   
     
     
         11 . The method of analyzing polymer according to  claim 10 , further comprising:
 derivatizing one of the first polymer and the second polymer, so as to prepare the other of the first polymer and the second polymer.   
     
     
         12 . A non-transitory recording medium storing a program for executing polymer analysis in an information processing device, the program, when executed, causing the information processing device to perform functions to:
 calculate, based on a first polymer molecule mass and a first repeating unit mass identified from a first mass spectrum of a first polymer, at least one mass candidate for a non-primary-chain segment of the first polymer;   apply Kendrick Mass Defect (KMD) analysis on the at least one mass candidate using the first repeating unit mass, to thereby produce a first KMD analysis result;   apply KMD analysis on a second mass spectrum of a second polymer having a non-primary-chain segment which is identical to the non-primary-chain segment of the first polymer, using a second repeating unit mass identified from the second mass spectrum, to thereby produce a second KMD analysis result; and   produce an image for identifying a mass of the non-primary-chain segment or judge the mass of the non-primary-chain segment based on the first KMD analysis result and the second KMD analysis result.

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