Storing and recovering critical data in a memory device

Abstract

The disclosed embodiments are related to storing critical data in a memory device such as Flash memory device. In one embodiment, a method performed by a controller of a memory device comprises receiving a critical operation from a host processor, the critical operation accessing a memory array; retrieving a temperature value of the memory array from a temperature sensor; and conditionally processing the critical operation based on the temperature value.

1 . A device comprising:
 a memory array, the memory array comprising a plurality of addressable memory cells;   a temperature sensor positioned at a first location with respect to the memory array, the temperature sensor configured to record an average temperature of the memory array; and   a controller, the controller positioned at a second location with respect to the memory array, the controller configured to:
 receive a critical operation from a host processor, 
 retrieve a temperature value of the memory array from the temperature sensor, and 
 conditionally process the critical operation based on the temperature value. 
   
     
     
         2 . The device of  claim 1 , wherein the critical operation comprises a critical read operation, the critical read operation including an address. 
     
     
         3 . The device of  claim 2 , the controller further configured to:
 query a critical access table using the address to identify a plurality of addresses distributed among the plurality of addressable memory cells;   retrieve temperature data from the plurality of addresses; and   process the critical read operation based on the temperature data and the temperature value returned by the temperature sensor.   
     
     
         4 . The device of  claim 3 , wherein processing the critical read operation comprises executing a majority voter function on the temperature data, the majority voter function returning a selected temperature value from the temperature data. 
     
     
         5 . The device of  claim 4 , wherein processing the critical read operation comprises determining that the temperature value is within a pre-configured range from the selected temperature value and reading data at the address included in the critical read operation. 
     
     
         6 . The device of  claim 5 , wherein processing the critical read operation comprises determining that the temperature value is not within a pre-configured distance from the selected temperature value and returning an error. 
     
     
         7 . The device of  claim 1 , the critical operation comprising a critical write operation. 
     
     
         8 . The device of  claim 7 , wherein conditionally processing the critical operation comprises writing the temperature value to a plurality of locations in the memory array. 
     
     
         9 . The device of  claim 8 , wherein writing the temperature value to a plurality of locations in the memory array comprises writing the temperature value to a plurality of single-level cell (SLC) locations in the memory array. 
     
     
         10 . A method comprising:
 receiving a critical operation from a host processor,   retrieving a temperature value of a memory array from a temperature sensor, the temperature sensor positioned at a first location with respect to the memory array and configured to record an average temperature of the memory array; and   conditionally processing the critical operation based on the temperature value.   
     
     
         11 . The method of  claim 10 , wherein the critical operation comprises a critical read operation, the critical read operation including an address. 
     
     
         12 . The method of  claim 11 , further comprising:
 querying a critical access table using the address to identify a plurality of addresses distributed among a plurality of addressable memory cells of the memory array;   retrieving temperature data from the plurality of addresses; and   processing the critical read operation based on the temperature data and the temperature value returned by the temperature sensor.   
     
     
         13 . The method of  claim 12 , wherein processing the critical read operation comprises executing a majority voter function on the temperature data, the majority voter function returning a selected temperature value from the temperature data. 
     
     
         14 . The method of  claim 13 , wherein processing the critical read operation comprises determining that the temperature value is within a pre-configured range from the selected temperature value and reading data at the address included in the critical read operation. 
     
     
         15 . The method of  claim 14 , wherein processing the critical read operation comprises determining that the temperature value is not within a pre-configured distance from the selected temperature value and returning an error. 
     
     
         16 . The method of  claim 10 , the critical operation comprising a critical write operation. 
     
     
         17 . The method of  claim 16 , wherein conditionally processing the critical operation comprises writing the temperature value to a plurality of locations in the memory array. 
     
     
         18 . The method of  claim 17 , wherein writing the temperature value to a plurality of locations in the memory array comprises writing the temperature value to a plurality of single-level cell (SLC) locations in the memory array. 
     
     
         19 . A non-transitory computer-readable storage medium for tangibly storing computer program instructions capable of being executed by a computer processor, the computer program instructions defining steps of:
 receiving a critical operation from a host processor,   retrieving a temperature value of a memory array from a temperature sensor, the temperature sensor positioned at a first location with respect to the memory array and configured to record an average temperature of the memory array; and   conditionally processing the critical operation based on the temperature value.   
     
     
         20 . The non-transitory computer-readable storage medium of  claim 19 , wherein:
 when the critical operation comprises a critical read operation including an address, the steps further comprise:
 querying a critical access table using the address to identify a plurality of addresses distributed among a plurality of addressable memory cells of the memory array, 
 retrieving temperature data from the plurality of addresses, and 
 processing the critical read operation based on the temperature data and the temperature value returned by the temperature sensor; and 
   when the critical operation comprises a critical write operation, the steps further comprise writing the temperature value to a plurality of locations in the memory array.