Voltage comparison circuit

Abstract

A comparator receives a target voltage and a reference voltage at its inverting and non-inverting input terminals, and outputs a signal corresponding to the level relationship between those voltages. A node provided on the output side of the comparator is fed with a signal equivalent to the output signal of the comparator. Between the node and the non-inverting input terminal of the comparator, a capacitor is inserted.

1 .- 12 . (canceled) 
     
     
         13 . A voltage comparison circuit comprising:
 a comparator having
 an output terminal, 
 a first input terminal fed with a first voltage, and 
 a second input terminal fed with a second voltage, 
   the comparator being configured
 to output from the output terminal a signal with a predetermined first level in a first state where a level of the first voltage is lower than a level of the second voltage, and 
 to output from the output terminal a signal with a predetermined second level different from the first level in a second state where the level of the first voltage is higher than the level of the second voltage; 
   a logic circuit configured to output a binary signal in accordance with an output signal of the comparator;   a capacitor, and   a voltage division circuit configured to divide an input voltage using a plurality of voltage division resistors connected in series with each other,   wherein   one end of the capacitor is connected to the first input terminal,   another end of the capacitor is fed with the binary signal,   the first voltage appears at a connection node between first and second voltage division resistors included in the plurality of voltage division resistors, the connection node being connected to the first input terminal of the comparator,   the capacitor and the voltage division resistors in the voltage division circuit constitute a high-pass filter, and   the high-pass filter is configured such that, when a rise in the first voltage causes a change of a level of the output signal of the comparator from the first level to the second level, the high-pass filter delivers an alternating-current signal based on the change to the first input terminal and thereby further raises the first voltage.   
     
     
         14 . The voltage comparison circuit according to  claim 13 , wherein
 the voltage division circuit is configured to give the comparator hysteresis by varying, in accordance with the output signal of the comparator, a division ratio used when the first voltage is generated from the input voltage.   
     
     
         15 . The voltage comparison circuit according to  claim 13 , further comprising:
 another voltage division circuit configured to generate the second voltage by dividing a predetermined voltage using a plurality of other voltage division resistors connected in series with each other,   wherein the another voltage division circuit is configured to give the comparator hysteresis by varying, in accordance with the output signal of the comparator, a division ratio used when the second voltage is generated from the predetermined voltage.   
     
     
         16 . A semiconductor device including the voltage comparison circuit according to  claim 13 , wherein the voltage comparison circuit is formed as a semiconductor integrated circuit. 
     
     
         17 . A voltage comparison circuit comprising:
 a comparator having
 an output terminal, 
 a first input terminal fed with a first voltage, and 
 a second input terminal fed with a second voltage, 
   the comparator being configured
 to output from the output terminal a signal with a predetermined first level in a first state where a level of the first voltage is lower than a level of the second voltage, and 
 to output from the output terminal a signal with a predetermined second level different from the first level in a second state where the level of the first voltage is higher than the level of the second voltage; 
   a logic circuit configured to output a binary signal in accordance with an output signal of the comparator;   a capacitor, and   a voltage division circuit configured to divide an input voltage using a plurality of voltage division resistors connected in series with each other,   wherein   one end of the capacitor is connected to the first input terminal,   another end of the capacitor is fed with the binary signal,   the first voltage appears at a connection node between first and second voltage division resistors included in the plurality of voltage division resistors, the connection node being connected to the first input terminal of the comparator,   the capacitor and the voltage division resistors in the voltage division circuit constitute a high-pass filter, and   the high-pass filter is configured such that, when a rise in the first voltage causes a change of a level of the output signal of the comparator from the first level to the second level, the high-pass filter delivers an alternating-current signal based on the change to the first input terminal and thereby momentarily raises the first voltage to more than a value that depends, at least in part, on respective values of the first and second voltage division resistances.   
     
     
         18 . The voltage comparison circuit according to  claim 17 , wherein
 the voltage division circuit is configured to give the comparator hysteresis by varying, in accordance with the output signal of the comparator, a division ratio used when the first voltage is generated from the input voltage.   
     
     
         19 . The voltage comparison circuit according to  claim 17 , further comprising:
 another voltage division circuit configured to generate the second voltage by dividing a predetermined voltage using a plurality of other voltage division resistors connected in series with each other,   wherein the another voltage division circuit is configured to give the comparator hysteresis by varying, in accordance with the output signal of the comparator, a division ratio used when the second voltage is generated from the predetermined voltage.   
     
     
         20 . A semiconductor device including the voltage comparison circuit according to  claim 17 , wherein the voltage comparison circuit is formed as a semiconductor integrated circuit.