US2023335598A1PendingUtilityA1

Composite oxide semiconductor and method for manufacturing the same

Assignee: SEMICONDUCTOR ENERGY LABPriority: Apr 1, 2016Filed: Jun 23, 2023Published: Oct 19, 2023
Est. expiryApr 1, 2036(~9.7 yrs left)· nominal 20-yr term from priority
H10P 14/2924H10P 14/2918H10P 14/22H10P 14/3434H10P 14/3426H10P 14/3238H10P 14/2922H10D 64/511H10D 64/60H10D 62/8303H10D 62/126H10D 62/82H10D 62/81H10D 30/01H10D 30/6757H10D 30/6755H10D 30/6756H10D 30/6734H10D 30/6723H10D 30/6713H10D 30/6739H10D 30/673H10D 62/80H10D 99/00H01L 29/24H01L 29/0692H01L 29/12H01L 29/267H01L 29/4232H01L 29/43H01L 29/66045H01L 21/02414H01L 21/02428
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Claims

Abstract

The field-effect mobility and reliability of a transistor including an oxide semiconductor film are improved. A semiconductor layer of a transistor is formed using a composite oxide semiconductor in which a first region and a second region are mixed. The first region includes a plurality of first clusters containing one or more of indium, zinc, and oxygen as a main component. The second region includes a plurality of second clusters containing one or more of indium, an element M (M represents Al, Ga, Y, or Sn), zinc, and oxygen. The first region includes a portion in which the plurality of first clusters are connected to each other. The second region includes a portion in which the plurality of second clusters are connected to each other.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A display device comprising:
 a pixel portion and a driver circuit portion, each over a substrate,   wherein the pixel portion includes a first transistor and the driver circuit portion includes a second transistor,   wherein the first transistor includes a composite oxide semiconductor in a channel region,   wherein the composite oxide semiconductor includes a first region and a second region,   wherein each of the first region and the second region includes In, an element M, and Zn,   wherein the element M is at least one of Al, Ga, Y and Sn,   wherein the first region has a higher atomic ratio of In to the element M than the second region,   wherein a portion of the first region is surrounded by the second region, and   wherein a portion of the second region is surrounded by the first region.   
     
     
         2 . A display device comprising:
 a pixel portion and a driver circuit portion, each over a substrate,   wherein the pixel portion includes a first transistor and the driver circuit portion includes a second transistor,   wherein the second transistor includes a composite oxide semiconductor in a channel region,   wherein the composite oxide semiconductor includes a first region and a second region,   wherein each of the first region and the second region includes In, an element M, and Zn,   wherein the element M is at least one of Al, Ga, Y and Sn,   wherein the first region has a higher atomic ratio of In to the element M than the second region,   wherein a portion of the first region is surrounded by the second region, and   wherein a portion of the second region is surrounded by the first region.   
     
     
         3 . A display device comprising:
 a pixel portion and a driver circuit portion, each over a substrate,   wherein the pixel portion includes a first transistor and the driver circuit portion includes a second transistor,   wherein each of the first transistor and the second transistor includes a composite oxide semiconductor in a channel region,   wherein the composite oxide semiconductor includes a first region and a second region,   wherein each of the first region and the second region includes In, an element M, and Zn,   wherein the element M is at least one of Al, Ga, Y and Sn,   wherein the first region has a higher atomic ratio of In to the element M than the second region,   wherein a portion of the first region is surrounded by the second region, and   wherein a portion of the second region is surrounded by the first region.

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