Systems and methods for calibrating display systems

Abstract

A method of calibrating a display system, the method comprising: displaying a test pattern including a plurality of blobs; detecting one or more base blobs in the displayed test pattern; identifying, based on the detected base blobs, patches of the test pattern, wherein each patch comprises one of the base blobs and a subset of additional blobs detected in the displayed test pattern; determining a patch location for at least one patch within the test pattern based on the subset of the additional blobs in the patch to determine a blob location for at least one detected blob; determining a calibration parameter for the display system based on the blob location and a detected attribute of the at least one detected blob; and calibrating the projector using the calibration parameter.

1 . A method of calibrating a display system, the method comprising:
 displaying a test pattern;   identifying patches of the displayed test pattern, wherein each patch comprises a subset of the displayed test pattern;   determining a patch location for at least one patch within the test pattern based on detected attributes of the patch;   determining a calibration parameter for the display system based on the patch location and at least one of the detected attributes of the patch; and   calibrating the display system using the calibration parameter.   
     
     
         2 . The method of  claim 1 , wherein identifying patches of the test pattern comprises:
 detecting one or more base features in the displayed test pattern; and   identifying the patches of the test pattern based on the one or more detected base features.   
     
     
         3 . The method of  claim 2 , wherein detecting the one or more base features comprises detecting a white feature in the displayed test pattern. 
     
     
         4 . The method of  claim 1 , wherein determining the patch location comprises:
 determining a set of colors present in the patch;   defining a patch address for the patch based on set of colors; and   determining the patch location within the test pattern associated with the patch address.   
     
     
         5 . The method of  claim 4 , wherein each patch comprises a set of blobs, and wherein determining the set of colors comprises determining a blob color for each blob in the patch. 
     
     
         6 . The method of  claim 5 , further comprising identifying a red reference blob, a green reference blob and a blue reference blob. 
     
     
         7 . The method of  claim 6 , further comprising ordering each additional blob in the patch based on its spatial relationship within the patch to the red reference blob, the green reference blob, and the blue reference blob to generate an ordered list of blob colors; and
 wherein the patch address is defined based on the ordered list of blob colors.   
     
     
         8 . The method of  claim 4 , further comprising verifying the patch address against a predefined list of valid patch addresses; and when the patch address is not a valid patch address, correcting the patch address based on the list of valid patch addresses. 
     
     
         9 . The method of  claim 1 , further comprising:
 defining a macro-patch comprising two or more patches of the test pattern;   determining a hyper-address for the macro-patch, the hyper-addresses including respective patch addresses of the two or more patches forming the hyper-address;   verifying the hyper-address against a predefined list of valid hyper-addresses; and   when the hyper-address is not a valid hyper-address, determining a correct hyper-address and correcting at least one of the respective patch addresses of the hyper-address.   
     
     
         10 . The method of  claim 1 , wherein determining the calibration parameters comprises:
 obtaining a target attribute for the detected attribute of the patch based on the patch location; and   defining the calibration parameters based on a difference between the detected attribute and the target attribute.   
     
     
         11 . A system comprising:
 a display system configured to project a test pattern onto a surface;   a camera configured to capture an image of at least a portion of the projected test pattern; and   a processor configured to:
 identify, using the captured image, a patch of the test pattern, wherein the patch comprises a subset of the test pattern; 
 determine a patch location for the patch within the test pattern based on detected attributes of the patch; 
 determine a calibration parameter for the display system based on the patch location and one of the detected attributes of the patch; and 
 calibrate the display system using the calibration parameter. 
   
     
     
         12 . The system of  claim 11 , wherein, to identify a patch of the test pattern, the processor is configured to:
 detect one or more base features in the test pattern; and   identify the patches of the test pattern based on the one or more detected base features.   
     
     
         13 . The system of  claim 12 , wherein the one or more base features comprises a white feature in the test pattern. 
     
     
         14 . The system of  claim 11 , wherein to determine the patch location, the processor is configured to:
 determine a set of colors present in the patch;   define a patch address for the patch based on set of colors; and   determine the patch location within the test pattern associated with the patch address.   
     
     
         15 . The system of  claim 14 , wherein each patch comprises a set of blobs, and wherein the processor is configured to determine a blob color for each blob in the patch. 
     
     
         16 . The system of  claim 15 , wherein the processor is configured to identify a red reference blob, a green reference blob and a blue reference blob. 
     
     
         17 . The system of  claim 16 , wherein the processor is configured to order each additional blob in the patch based on a spatial relationship within the patch to the red reference blob, the green reference blob, and the blue reference blob to generate an ordered list of blob colors; and
 wherein the patch address is defined based on the ordered list of blob colors.   
     
     
         18 . The system of  claim 14 , wherein the processor is further configured to verify the patch address against a predefined list of valid patch addresses; and when the patch address is not a valid patch address, correct the patch address based on the list of valid patch addresses. 
     
     
         19 . The system of  claim 11 , wherein the processor is further configured to:
 define a macro-patch comprising two or more patches of the test pattern;   determine a hyper-address for the macro-patch, the hyper-addresses including respective patch addresses of the two or more patches forming the hyper-address;   verify the hyper-address against a predefined list of valid hyper-addresses; and   when the hyper-address is not a valid hyper-address, determine a correct hyper-address and correct at least one of the respective patch addresses of the hyper-address.   
     
     
         20 . The system of  claim 11 , wherein to determine the calibration parameter, the processor is configured to:
 obtain a target attribute for the detected attribute of the patch based on the patch location; and   define the calibration parameters based on a difference between the detected attribute and the target attribute.   
     
     
         21 . The system of  claim 11 , wherein the camera is integrated with the display system.