Light Source for High Power Coherent Light, Imaging System, and Method of Using Relativistic Electrons for Imaging and Treatment

Abstract

A light source for high power coherent light can include multiparticle relativistic bunches of electrons generating high intensity propagating fields. Coherent emission between electrons may also be utilized. The source may be independent of any medium or media to remove all constraints on the wavelength of the light emitted. And at least a portion of a single alternating magnetic field for accelerating the electron bunches can be included. The color or wavelength of the produced light can be determined solely by the parameters of the electron bunches and the alternating field. The source can be used for imaging, such as medical imaging or for security, including concealed weapons, and for quality control.

What is claimed is: 
     
         1 . A system comprising:
 a compact accelerator system configured to produce multiparticle relativistic bunches of electrons to generate high intensity propagating fields of emitted light; wherein the compact accelerator is independent of any medium or media to remove all constraints on the wavelength of the emitted light; and   at least a portion of a single alternating magnetic field for accelerating the electron bunches to produce light;   wherein a color or wavelength of the emitted light is determined solely by parameters of the bunches of electrons and the alternating magnetic field.   
     
     
         2 . The system of  claim 1  wherein the electrons are traveling relativistically such that their mass is at least several times their rest mass. 
     
     
         3 . The system of  claim 1  wherein light produced is 1-1000 watts and wavelength of the light produced is in the range from 3 mm to 30 micrometers. 
     
     
         4 . The system of  claim 1  wherein the propagating fields from the bunches of electrons are spontaneously induced by a series of magnets of alternating fields. 
     
     
         5 . The system of  claim 1  wherein the propagating fields from the bunches of electrons are stimulated using an outside propagating field from an external source. 
     
     
         6 . The system of  claim 1  wherein the propagating fields from the bunches of electrons are stimulated using a propagating field from an electron bunch itself to create a self-amplified spontaneous emission. 
     
     
         7 . The system of  claim 1  wherein the propagating fields from the bunches of electrons are stimulated using a propagating field circulated inside an optical cavity surrounding the magnets of alternating fields. 
     
     
         8 . The system of  claim 1  further comprising an imaging system and wherein the propagating fields from the bunches of electrons is intercepted by the imaging system to cause an object to be illuminated. 
     
     
         9 . The system of  claim 1  wherein the electron bunches are produced by a laser at a gun cathode and wherein the gun cathode is thermionic. 
     
     
         10 . The system of  claim 1  wherein the electron bunch length is less than 500 fs full width half-maximum. 
     
     
         11 . The system of  claim 1  further comprising a linear accelerator and wherein the linear accelerator operates at frequencies corresponding to S-band or L-band and wherein the linear accelerator is pulsed. 
     
     
         12 . The system of  claim 1  further comprising a beam transport system and wherein the beam transport system manipulates an electron bunch length. 
     
     
         13 . The system of  claim 12  wherein the electron bunch length is manipulated by one or more of an electric field, magnetic field or by use of a dielectric wave guide. 
     
     
         14 . The system of  claim 1  further comprising an optical system that is used to image an illuminated object to an imaging plane. 
     
     
         15 . The system of  claim 1  further comprising a detection system configured to measure a reflection, transmission, or absorption of an illuminated object as a function of wavelength. 
     
     
         16 . The system of  claim 1  wherein the light is utilized to modify the physical, biological, or chemical characteristics of the object. 
     
     
         17 . The system of  claim 1  further comprising configuring the system to produce radiation of greater than 5% bandwidth for the purpose of interrogating the reflection, absorption, or transmission of an object. 
     
     
         18 . The system of  claim 1  further comprising configuring the system to produce radiation of less than 5% bandwidth and wherein the output wavelength is varied by less than or equal to 5% for the purpose of interrogating the reflection, absorption, or transmission of an object. 
     
     
         19 . The system of  claim 1  further comprising configuring the system to produce radiation for the purpose of measuring the water content of an object. 
     
     
         20 . The light source of  claim 1  wherein measurements of the emitted light are used to control or modify parameters of the electron bunches by feedback for adjusting or stabilizing the emitted light power, frequency, bandwidth or direction of propagation.