Methods and devices for testing a device under test using multiple signals transmitted via a bidirectional real-time interface

Abstract

Embodiments of the present invention provide an automated test equipment (a “tester”) for testing a device under test, including a bidirectional dedicated real-time handler interface. Some embodiments include an interface having a trigger function, a fixed endpoint interface, an interface arranged on a test head, and/or a number of lines/communication channels adapted to a specific communication task, without separate signal lines, for example. The bidirectional dedicated real-time handler interface can be used to transmit a multiple signals, such as a thermal control signal, synchronization signal, and/or other information to the handler in real-time, and the transmitted signals can be test site specific. The real-time signaling advantageously improves testing accuracy and efficiency.

What is claimed is: 
     
         1 . Automated test equipment (ATE) for testing a device under test (DUT), the ATE comprising:
 a processor; and   a real-time handler interface,   wherein the real-time handler interface is operable to:
 provide a trigger signal to a handler coupled to the real-time handler interface to trigger a temperature control function of the handler; and 
 provide an additional signal, other than the trigger signal, wherein the additional signal comprises at least one of: control information used to generate or modify a temperature control profile; control information used to adjust temperature regulation performed by the handler; information pertaining to a measurement performed by the ATE; information pertaining to a value extracted from a data stream by the ATE; test state parameters; and alarm information. 
   
     
     
         2 . The ATE as described in  claim 1 , wherein the processor is operable to extract a value from a digital data stream of a DUT coupled to the handler, and wherein the real-time handler interface is operable to transmit the value to the handler. 
     
     
         3 . The ATE as described in  claim 1 , wherein the real-time handler interface is operable to transmit a value measured by the ATE to the handler. 
     
     
         4 . The ATE as described in  claim 1 , wherein the real-time handler interface is operable to transmit signals between the ATE and the handler with a latency below 1 ms. 
     
     
         5 . The ATE as described in  claim 1 , wherein a latency of said additional signal and a latency said trigger signal are less than a time constant of a control loop that controls the temperature control function. 
     
     
         6 . The ATE as described in  claim 1 , wherein the temperature control function comprises executing a control loop using the real-time handler interface, and wherein the temperature control function is operable to consider real-time information transmitted via the real-time handler interface. 
     
     
         7 . The ATE as described in  claim 6 , wherein the control loop comprises the automated test equipment, and wherein the processor is operable to regulate testing in concert with the handler. 
     
     
         8 . The ATE as described in  claim 1 , wherein the real-time handler interface is operable to provide said trigger signal and said additional signal for use by the temperature control function in real-time. 
     
     
         9 . The ATE as described in  claim 1 , wherein the real-time handler interface is comprised in a temperature regulation loop. 
     
     
         10 . The ATE as described in  claim 1 , wherein the processor is operable to perform integrated regulation distributed between the automated test equipment and the handler. 
     
     
         11 . The ATE as described in  claim 1 , further comprising a pattern generator, wherein the processor is operable to control a regulation function for testing the DUT based on a pattern generated by the pattern generator. 
     
     
         12 . A handler for testing a device under test (DUT), the handler comprising:
 a circuit; and   a real-time tester interface,   wherein the circuit is operable to:
 receive a trigger signal and an additional signal via the real-time tester interface; and 
 control a temperature of a DUT site, and 
   wherein the additional signal comprises at least one of:
 control information pertaining to a temperature control profile; control information pertaining to temperature regulation performed by the handler; information pertaining to a value determined by an automated test equipment (ATE); information pertaining to a value extracted from a data stream by the ATE; test state parameters; and alarm information. 
   
     
     
         13 . The handler as described in  claim 12 , wherein the circuit is further operable to:
 determine a temperature parameter comprising at least one of: a cooling amplitude; a cooling duration; and a cooling strength; and   use the temperature parameter to generate at least one of: another temperature control profile; and a temperature regulation profile.   
     
     
         14 . The handler as described in  claim 12 , wherein the circuit executes a temperature control function based on real-time information received via the real-time tester interface. 
     
     
         15 . The handler as described in  claim 14 , wherein the temperature control function comprises a control loop that uses the circuit, and wherein the circuit is operable to perform integrated regulation in concert with the ATE during testing of the DUT. 
     
     
         16 . The handler as described in  claim 12 , wherein the real time tester interface is operable to provide said trigger signal and said additional signal for use by the temperature control function in real-time. 
     
     
         17 . The handler as described in  claim 12 , wherein the circuit is further operable to perform the temperature control function during testing of the DUT. 
     
     
         18 . The handler as described in  claim 12 , wherein the real-time tester interface is accessed by a temperature regulation loop of the temperature control function. 
     
     
         19 . The handler as described in  claim 12 , wherein the circuit is further operable to perform integrated regulation, wherein the temperature regulation is distributed between the ATE and the circuit. 
     
     
         20 . A method of testing a device under test (DUT) using a handler, the method comprising:
 providing a trigger signal to a handler via a real-time handler interface to trigger a temperature control function of the handler; and   providing an additional signal to the handler via the real-time handler interface, wherein the additional signal comprises at least one of: control information used to generate or modify a temperature control profile; control information used to generate or modify temperature regulation performed by the handler; information pertaining to a value determined by an automated test equipment (ATE); information pertaining to a value extracted from a data stream of the DUT by the ATE; test state parameters; and alarm information.   
     
     
         21 . A method of testing a device under test (DUT) using an automated test equipment (ATE), the method comprising:
 receiving a trigger signal from the ATE via a real-time handler interface to trigger a temperature control function of a handler; and   receiving an additional signal from the ATE via the real-time handler interface, wherein the additional signal comprises at least one of: control information used to generate or modify a temperature control profile; control information used to generate or modify temperature regulation performed by the handler; information pertaining to a value determined by the ATE; information pertaining to a value extracted from a data stream of the DUT by the ATE; test state parameters; and alarm information.