Methods and devices for testing a device under test using a synchronization signal

Abstract

Embodiments of the present invention provide an automated test equipment (a “tester”) for testing a device under test, including a bidirectional dedicated real-time handler interface. Some embodiments use the bidirectional dedicated real-time handler interface to transmit a synchronization signal between the handler and the automated test equipment to synchronize a function of the handler in real-time, which advantageously improves testing efficiency and accuracy.

What is claimed is: 
     
         1 . Automated test equipment for testing a device under test (DUT), the automated test equipment comprising:
 a test computer; and   a real-time handler interface coupled to a handler,   wherein the real-time handler interface is operable to:
 transmit a trigger signal from the test computer to the handler to trigger a temperature control function of the handler; and 
 transmit a synchronization signal from the test computer to the handler to synchronize another function of the handler, other than the temperature control function, in real-time. 
   
     
     
         2 . The automated test equipment as described in  claim 1 , wherein the real-time handler interface is further operable to perform an active synchronization with the handler based on the synchronization signal, and wherein the active synchronization is free of any wait insertions. 
     
     
         3 . The automated test equipment as described in  claim 1 , wherein the real-time handler interface is operable to transmit calibration timing information to the handler, and wherein the handler is operable to perform calibration of the handler based on the calibration timing information. 
     
     
         4 . The automated test equipment as described in  claim 1 , wherein the real-time handler interface is further operable to transmit another signal indicating that the DUT is powered or biased in a predetermined manner. 
     
     
         5 . The automated test equipment as described in  claim 1 , wherein the real-time handler interface is further operable to transmit another signal when a predetermined test condition is satisfied. 
     
     
         6 . The automated test equipment as described in  claim 1 , wherein the real-time handler interface is further operable to provide the synchronization signal to the handler to trigger a temperature measurement by the handler. 
     
     
         7 . The automated test equipment as described in  claim 1 , wherein the handler is operable to perform a thermal diode calibration according to the synchronization signal, and wherein the thermal diode calibration comprises a delta temperature measurement, and wherein further the real-time handler interface is further operable to transmit real-time measurement timing information to the handler for performing the thermal diode calibration. 
     
     
         8 . The automated test equipment as described in  claim 1 , wherein the synchronization signal comprises time information for performing a measurement by the handler. 
     
     
         9 . The automated test equipment as described in  claim 1 , wherein the synchronization signal comprises at least one of: test state information; and device state information. 
     
     
         10 . A handler for testing a device under test (DUT) using automated test equipment, the handler comprising:
 a circuit; and   a real-time tester interface coupled to the DUT, wherein the circuit is operable to:
 receive a trigger signal from the automated test equipment; 
 trigger a temperature control function in response to the received trigger signal; 
 receive a synchronization signal from the automated test equipment; and 
 synchronize another function with the automated test equipment, other than the temperature control function, in response to the received synchronization signal. 
   
     
     
         11 . The handler as described in  claim 10 , wherein the circuit is further operable to:
 receive a signal for performing an active synchronization with the automated test equipment; and   perform active synchronization with the automated test equipment based on the synchronization signal, and   wherein the active synchronization is free of any wait insertions.   
     
     
         12 . The handler as described in  claim 10 , wherein the circuit is further operable to:
 receive calibration timing information from the automated test equipment to determine calibration timing; and   perform calibration to test the DUT based on the calibration timing information.   
     
     
         13 . The handler as described in  claim 10 , wherein the circuit is further operable to receive another signal from the automated test equipment, wherein the another signal indicates that the DUT is powered or biased in a predetermined manner. 
     
     
         14 . The handler as described in  claim 10 , wherein the circuit is further operable to receive a signal from the automated test equipment when a predetermined test condition is satisfied. 
     
     
         15 . The handler as described in  claim 10 , wherein the circuit is further operable to:
 receive another signal from the automated test equipment that triggers a temperature reading; and   perform the temperature measurement based on the synchronization signal.   
     
     
         16 . The handler as described in  claim 10 , wherein the circuit is further operable to:
 perform a thermal diode calibration based on the synchronization signal received from the automated test equipment, wherein the thermal diode calibration comprises a delta temperature measurement;   perform the delta temperature measurement; and   receive real-time measurement timing information from the automated test equipment for performing the thermal diode calibration.   
     
     
         17 . The handler as described in  claim 10 , wherein the synchronization signal comprises time information, and wherein the real-time tester interface is further operable to cause the circuit to perform a measurement based on the time information. 
     
     
         18 . The handler as described in  claim 10 , wherein the synchronization signal comprises at least one of: test state information; and device state information. 
     
     
         19 . A method of testing a device under test, the method comprising:
 transmitting a trigger signal to a handler via a real-time handler interface to trigger a temperature control function of the handler;   transmitting a synchronization signal to the handler via the real-time handler interface; and   synchronizing another function of the handler according to the synchronization signal, other than the temperature control function.   
     
     
         20 . A method of testing a device under test, the method comprising:
 receiving a trigger signal from an automated test equipment via a real-time tester interface;   triggering a temperature control function in response to the received trigger signal;   receiving a synchronization signal from the automated test equipment via the real-time tester interface; and   synchronizing another function with the automated test equipment, other than the temperature control function, in response to the received synchronization signal.