US2023220554A1PendingUtilityA1
Process for producing polycrystalline silicon
Est. expiryDec 17, 2038(~12.4 yrs left)· nominal 20-yr term from priority
Inventors:Markus Wenzeis
C01B 33/035C23C 16/52C01B 33/03C23C 16/24
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Claims
Abstract
Polycrystalline silicon is produced in a chemical vapour deposition reactor, wherein, outside the reactor at at least one position on at least one reactor component, vibrations of the reactor are measured using a measurement device and optionally recorded. The vibrations may be used to identify rod fall over and other events occurring within the reactor.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . Polycrystalline silicon is produced in a chemical vapour deposition reactor, wherein, outside the reactor at at least one position on at least one reactor component, vibrations of the reactor are measured using a measurement device and optionally recorded. The vibrations may be used to identify rod fall over and other events occurring within the reactor. A reactor for the deposition of polycrystalline silicon, comprising, as reactor components, a base plate, a reactor shell arranged on the base plate, at least one conduit for gas supply, at least one conduit for gas removal, and electrode holders for at least one heatable support body, and at least one measurement device for determining vibrations of the reactor, the measurement device mounted on one or more of the reactor components.
2 . The reactor of claim 1 , wherein the measurement device comprises an acceleration sensor and/or a microphone.
3 . The reactor of claim 1 , wherein the measurement device further comprises a recording system.
4 . The reactor of claim 1 , wherein the measurement device is coupled to a process control station for controlling the reactor.Join the waitlist — get patent alerts
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